TY - GEN
T1 - A new method for Scheimpflug camera calibration
AU - Legarda, Aritz
AU - Izaguirre, Alberto
AU - Arana, Nestor
AU - Iturrospe, Aitzol
PY - 2011
Y1 - 2011
N2 - An easy way to achieve higher depth of field in a camera-laser configuration is to tilt the image sensor respect to the lens plane, such that the image plane, laser plane and the lens plane intersect in a unique line (Scheimpflug condition [1]). If something has to be measured with this kind of cameras, a proper camera calibration must be done. The usual calibration methods are not valid in this case because they are based on the pin-hole camera model, this model being valid only for normal cameras, i.e. cameras that have the image plane and the lens plane parallel. Thus, a new camera model and its respective calibration must be developed, which includes the Scheimplug angle in the intrinsic camera parameters. In this article, the new camera model and its calibration are defined. Experimental results indicate that using this calibration cameras under Scheimpflug condition can be accurately calibrated.
AB - An easy way to achieve higher depth of field in a camera-laser configuration is to tilt the image sensor respect to the lens plane, such that the image plane, laser plane and the lens plane intersect in a unique line (Scheimpflug condition [1]). If something has to be measured with this kind of cameras, a proper camera calibration must be done. The usual calibration methods are not valid in this case because they are based on the pin-hole camera model, this model being valid only for normal cameras, i.e. cameras that have the image plane and the lens plane parallel. Thus, a new camera model and its respective calibration must be developed, which includes the Scheimplug angle in the intrinsic camera parameters. In this article, the new camera model and its calibration are defined. Experimental results indicate that using this calibration cameras under Scheimpflug condition can be accurately calibrated.
UR - http://www.scopus.com/inward/record.url?scp=80051979768&partnerID=8YFLogxK
U2 - 10.1109/IWECMS.2011.5952376
DO - 10.1109/IWECMS.2011.5952376
M3 - Article in proceeding
AN - SCOPUS:80051979768
SN - 9781612843957
T3 - 2011 10th International Workshop on Electronics, Control, Measurement and Signals, ECMS 11
BT - 2011 10th International Workshop on Electronics, Control, Measurement and Signals, ECMS 11
T2 - 2011 10th International Workshop on Electronics, Control, Measurement and Signals, ECMS 11
Y2 - 1 June 2011 through 3 June 2011
ER -