A review on IGBT module failure modes and lifetime testing

Ahmed Abuelnaga*, Mehdi Narimani, Amir Sajjad Bahman

*Kontaktforfatter

Publikation: Bidrag til tidsskriftReview (oversigtsartikel)peer review

153 Citationer (Scopus)
1339 Downloads (Pure)

Abstract

This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details.

OriginalsprogEngelsk
Artikelnummer9316255
TidsskriftIEEE Access
Vol/bind9
Sider (fra-til)9643-9663
Antal sider21
ISSN2169-3536
DOI
StatusUdgivet - 2021

Bibliografisk note

Funding Information:
This work was supported in part by the Natural Sciences and Engineering Research Council of Canada.

Publisher Copyright:
© 2013 IEEE.

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