TY - JOUR
T1 - A Temperature-Dependent Thermal Model of IGBT Modules Suitable for Circuit-Level Simulations
AU - Wu, Rui
AU - Wang, Huai
AU - Pedersen, Kristian Bonderup
AU - Ma, Ke
AU - Ghimire, Pramod
AU - Iannuzzo, Francesco
AU - Blaabjerg, Frede
PY - 2016/7
Y1 - 2016/7
N2 - A basic challenge in the IGBT transient simulation study is to obtain the realistic junction temperature, which demands not only accurate electrical simulations but also precise thermal impedance. This paper proposed a transient thermal model for IGBT junction temperature simulations during short circuits or overloads. The updated Cauer thermal model with varying thermal parameters is obtained by means of FEM thermal simulations with temperature-dependent physical parameters. The proposed method is applied to a case study of a 1700 V/1000 A IGBT module. Furthermore, a testing setup is built up to validate the simulation results, which is composed of a IGBT baseplate temperature control unit, an infrared camera with a maximum of 3 kHz sampling frequency, and a black-painted open IGBT module.
AB - A basic challenge in the IGBT transient simulation study is to obtain the realistic junction temperature, which demands not only accurate electrical simulations but also precise thermal impedance. This paper proposed a transient thermal model for IGBT junction temperature simulations during short circuits or overloads. The updated Cauer thermal model with varying thermal parameters is obtained by means of FEM thermal simulations with temperature-dependent physical parameters. The proposed method is applied to a case study of a 1700 V/1000 A IGBT module. Furthermore, a testing setup is built up to validate the simulation results, which is composed of a IGBT baseplate temperature control unit, an infrared camera with a maximum of 3 kHz sampling frequency, and a black-painted open IGBT module.
KW - Temperature measurement
KW - Insulated gate bipolar transistors (IGBTs)
KW - Modeling
KW - Power semiconductor devices
KW - Semiconductor device reliability
U2 - 10.1109/TIA.2016.2540614
DO - 10.1109/TIA.2016.2540614
M3 - Journal article
SN - 0093-9994
VL - 52
SP - 3306
EP - 3314
JO - I E E E Transactions on Industry Applications
JF - I E E E Transactions on Industry Applications
IS - 4
ER -