TY - JOUR
T1 - Advancements in point cloud-based 3D defect classification and segmentation for industrial systems
T2 - A comprehensive survey
AU - Rani, Anju
AU - Ortiz-Arroyo, Daniel
AU - Durdevic, Petar
N1 - Publisher Copyright:
© 2024 The Author(s)
PY - 2024/12
Y1 - 2024/12
N2 - In recent years, 3D point clouds (PCs) have gained significant attention due to their diverse applications across various fields, such as computer vision (CV), condition monitoring (CM), virtual reality, robotics, autonomous driving, etc. Deep learning (DL) has proven effective in leveraging 3D PCs to address various challenges encountered in 2D vision. However, applying deep neural networks (DNNs) to process 3D PCs presents unique challenges. This paper provides an in-depth review of recent advancements in DL-based industrial CM using 3D PCs, with a specific focus on defect shape classification and segmentation within industrial applications. Recognizing the crucial role of these aspects in industrial maintenance, the paper offers insightful observations on the strengths and limitations of the reviewed DL-based PC processing methods. This knowledge synthesis aims to contribute to understanding and enhancing CM processes, particularly within the framework of remaining useful life (RUL), in industrial systems.
AB - In recent years, 3D point clouds (PCs) have gained significant attention due to their diverse applications across various fields, such as computer vision (CV), condition monitoring (CM), virtual reality, robotics, autonomous driving, etc. Deep learning (DL) has proven effective in leveraging 3D PCs to address various challenges encountered in 2D vision. However, applying deep neural networks (DNNs) to process 3D PCs presents unique challenges. This paper provides an in-depth review of recent advancements in DL-based industrial CM using 3D PCs, with a specific focus on defect shape classification and segmentation within industrial applications. Recognizing the crucial role of these aspects in industrial maintenance, the paper offers insightful observations on the strengths and limitations of the reviewed DL-based PC processing methods. This knowledge synthesis aims to contribute to understanding and enhancing CM processes, particularly within the framework of remaining useful life (RUL), in industrial systems.
KW - Classification
KW - Condition monitoring
KW - Deep learning
KW - Defect detection
KW - Point cloud
KW - Segmentation
UR - http://www.scopus.com/inward/record.url?scp=85198605547&partnerID=8YFLogxK
U2 - 10.1016/j.inffus.2024.102575
DO - 10.1016/j.inffus.2024.102575
M3 - Journal article
AN - SCOPUS:85198605547
SN - 1566-2535
VL - 112
JO - Information Fusion
JF - Information Fusion
M1 - 102575
ER -