An analytical turn-on power loss model for 650-V GaN eHEMTs

Yanfeng Shen, Huai Wang, Zhan Shen, Frede Blaabjerg, Zian Qin

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

4 Citationer (Scopus)

Abstrakt

This paper proposes an improved analytical turn-on power loss model for 650-V GaN eHEMTs. The static characteristics, i.e., the parasitic capacitances and transconductance, are firstly modeled. Then the turn-on process is divided into multiple stages and analyzed in detail; as results, the time-domain solutions to the drain-source voltage and drain current are obtained. Finally, double-pulse tests are conducted to verify the proposed power loss model. This analytical model enables an accurate and fast switching behavior characterization and power loss prediction.
OriginalsprogEngelsk
Titel2018 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider6
ForlagIEEE Press
Publikationsdatomar. 2018
Sider913-918
ISBN (Trykt)978-1-5386-1181-4
ISBN (Elektronisk)978-1-5386-1180-7
DOI
StatusUdgivet - mar. 2018

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