An effective algorithm for maed problems with a new reliability model at the microgrid

Amirreza Naderipour, Akhtar Kalam*, Zulkurnain Abdul-Malek, Iraj Faraji Davoudkhani, Mohd Wazir Bin Mustafa, Josep M. Guerrero

*Kontaktforfatter

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OriginalsprogEngelsk
Artikelnummer257
TidsskriftElectronics (Switzerland)
Vol/bind10
Udgave nummer3
Sider (fra-til)1-23
Antal sider23
ISSN2079-9292
DOI
StatusUdgivet - 1 feb. 2021

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