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An effective algorithm for maed problems with a new reliability model at the microgrid
Amirreza Naderipour, Akhtar Kalam*, Zulkurnain Abdul-Malek, Iraj Faraji Davoudkhani, Mohd Wazir Bin Mustafa, Josep M. Guerrero
*Kontaktforfatter
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
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