An Embedded Enhanced-Boost Z-Source Inverter Topology with Fault-Tolerant Capabilities

Jing Yuan, Yongheng Yang, Yanfeng Shen, Wenjie Liu, Frede Blaabjerg, Ping Liu

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4 Citationer (Scopus)
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Abstrakt

This paper explores the fault tolerant capabilities of an Embedded Enhanced-Boost Z-Source Inverter (EEB-ZSI) for PV applications. Compared with the prior-art Embedded Source Inverters (E-ZSI) and Enhanced-Boost Z-Source Inverter (EB-ZSI), the proposed topology features that when one dc source (e.g., PV panel) is short-circuited (SC) or open-circuited (OC), the inverter can tolerate the faults and still operate with a compromised conversion ratio. However, the conversion ratio is still larger than the traditional E-ZSI. This topology can be further applied to the cascaded H-bridge inverter systems for multi-level applications with fault-handling capabilities. A detailed fault-tolerant analysis is conducted on the EEB-ZSI and simulations are provided to validate the analysis.
OriginalsprogEngelsk
TitelProceedings of IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Antal sider6
ForlagIEEE
Publikationsdatookt. 2018
Sider3712-3717
Artikelnummer8591424
ISBN (Trykt)978-1-5090-6685-8
ISBN (Elektronisk)978-1-5090-6684-1
DOI
StatusUdgivet - okt. 2018
Begivenhed44th Annual Conference of the IEEE Industrial Electronics Society - Omni Shoreham Hotel, Washington, USA
Varighed: 21 okt. 201823 okt. 2018
http://www.iecon2018.org/

Konference

Konference44th Annual Conference of the IEEE Industrial Electronics Society
LokationOmni Shoreham Hotel
LandUSA
ByWashington
Periode21/10/201823/10/2018
Internetadresse

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