TY - JOUR
T1 - An On-line Calibration Method for TSEP-based Junction Temperature Estimation
AU - Peng, Yingzhou
AU - Wang, Qian
AU - Wang, Haoran
AU - Wang, Huai
PY - 2022/12/1
Y1 - 2022/12/1
N2 - Temperature sensitive electrical parameters (TSEP) provide an indirect and noninvasive method for on-line junction temperature estimation of power semiconductor devices. It is known that the fundamental of TSEP-based methods is to calibrate the relationship between TSEP and junction temperature in advance. However, the calibration methods in the literature need to open the module, require pretesting, or record the operating data of a converter in the entire power rating range, which are inconvenient in field applications. This article proposes an on-line and noninvasive calibration method by measuring the data at three operating states that are already existed in the regular converter operation. It is achieved by measuring the accessible heatsink/case temperature and TSEP during converter regular operation. The concept, implementation, and error analysis of the proposed method are presented in this article. Experimental verification is given to prove the effectiveness, accuracy, and convenience of the proposed method.
AB - Temperature sensitive electrical parameters (TSEP) provide an indirect and noninvasive method for on-line junction temperature estimation of power semiconductor devices. It is known that the fundamental of TSEP-based methods is to calibrate the relationship between TSEP and junction temperature in advance. However, the calibration methods in the literature need to open the module, require pretesting, or record the operating data of a converter in the entire power rating range, which are inconvenient in field applications. This article proposes an on-line and noninvasive calibration method by measuring the data at three operating states that are already existed in the regular converter operation. It is achieved by measuring the accessible heatsink/case temperature and TSEP during converter regular operation. The concept, implementation, and error analysis of the proposed method are presented in this article. Experimental verification is given to prove the effectiveness, accuracy, and convenience of the proposed method.
KW - Calibration
KW - Estimation
KW - Index terms-Power semiconductor
KW - Junctions
KW - Temperature distribution
KW - Temperature measurement
KW - Thermal resistance
KW - Voltage measurement
KW - condition monitoring
KW - junction temperature
KW - power converter
UR - http://www.scopus.com/inward/record.url?scp=85120037596&partnerID=8YFLogxK
U2 - 10.1109/TIE.2021.3128886
DO - 10.1109/TIE.2021.3128886
M3 - Journal article
SN - 0278-0046
VL - 69
SP - 13616
EP - 13624
JO - I E E E Transactions on Industrial Electronics
JF - I E E E Transactions on Industrial Electronics
IS - 12
ER -