TY - JOUR
T1 - Analysis and optimisation through innovative driving strategy of high power IGBT performances/EMI reduction trade-off for converter systems in railway applications
AU - Busatto, G.
AU - Fratelli, L.
AU - Abbate, C.
AU - Manzo, R.
AU - Iannuzzo, F.
PY - 2004/9/1
Y1 - 2004/9/1
N2 - In railway applications possible interaction between power train and signalling system requires efforts to Electro Magnetic Compatibility (EMC) problems. With the progress of power device technology in recent years, it has become feasible to improve performances of power electronics systems; however EMI noise, caused by fast switching commutations in power converters, has to be managed. EMC control has, therefore, become a worldwide topic, and requests for EMI noise reduction have become very strong. In the paper, after a deep analysis of EMC features in railway applications, two innovative driving strategies have been introduced and characterized, in order to find a good trade-off between high power IGBT performances and EMI reduction constraints. Characterization and discussion are based on experimental basis.
AB - In railway applications possible interaction between power train and signalling system requires efforts to Electro Magnetic Compatibility (EMC) problems. With the progress of power device technology in recent years, it has become feasible to improve performances of power electronics systems; however EMI noise, caused by fast switching commutations in power converters, has to be managed. EMC control has, therefore, become a worldwide topic, and requests for EMI noise reduction have become very strong. In the paper, after a deep analysis of EMC features in railway applications, two innovative driving strategies have been introduced and characterized, in order to find a good trade-off between high power IGBT performances and EMI reduction constraints. Characterization and discussion are based on experimental basis.
UR - http://www.scopus.com/inward/record.url?scp=4544251908&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2004.07.071
DO - 10.1016/j.microrel.2004.07.071
M3 - Journal article
AN - SCOPUS:4544251908
SN - 0026-2714
VL - 44
SP - 1443
EP - 1448
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 9-11
ER -