Assessment of the Huygens’ Box Method With Different Sources Near Obstacles

M. Sørensen, I. B. Bonev, O. Franek, G. F. Pedersen

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

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OriginalsprogEngelsk
TidsskriftIEEE Transactions on Electromagnetic Compatibility
Antal sider10
ISSN0018-9375
DOI
StatusE-pub ahead of print - 16 maj 2019

Emneord

  • Numerical models
  • Electromagnetic compatibility
  • Microstrip
  • Integrated circuit modeling
  • Resonant frequency
  • Predictive models
  • Electromagnetic simulations
  • Huygen’s box method
  • near-field scan
  • surface equivalence principle

Citer dette

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title = "Assessment of the Huygens’ Box Method With Different Sources Near Obstacles",
keywords = "Numerical models, Electromagnetic compatibility, Microstrip, Integrated circuit modeling, Resonant frequency, Predictive models, Electromagnetic simulations, Huygen’s box method, near-field scan, surface equivalence principle",
author = "M. S{\o}rensen and Bonev, {I. B.} and O. Franek and Pedersen, {G. F.}",
year = "2019",
month = "5",
day = "16",
doi = "10.1109/TEMC.2019.2908354",
language = "English",
journal = "I E E E Transactions on Electromagnetic Compatibility",
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Assessment of the Huygens’ Box Method With Different Sources Near Obstacles. / Sørensen, M.; Bonev, I. B.; Franek, O.; Pedersen, G. F.

I: IEEE Transactions on Electromagnetic Compatibility, 16.05.2019.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Assessment of the Huygens’ Box Method With Different Sources Near Obstacles

AU - Sørensen, M.

AU - Bonev, I. B.

AU - Franek, O.

AU - Pedersen, G. F.

PY - 2019/5/16

Y1 - 2019/5/16

KW - Numerical models

KW - Electromagnetic compatibility

KW - Microstrip

KW - Integrated circuit modeling

KW - Resonant frequency

KW - Predictive models

KW - Electromagnetic simulations

KW - Huygen’s box method

KW - near-field scan

KW - surface equivalence principle

U2 - 10.1109/TEMC.2019.2908354

DO - 10.1109/TEMC.2019.2908354

M3 - Journal article

JO - I E E E Transactions on Electromagnetic Compatibility

JF - I E E E Transactions on Electromagnetic Compatibility

SN - 0018-9375

ER -