Battery Aging Behavior Evaluation under Variable and Constant Temperatures with Real Loading Profiles

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4 Citationer (Scopus)

Abstract

Studying and analyzing battery aging behavior is crucial in battery health prognostic and management. This paper conducts novel and comprehensive experiments to evaluate battery aging under variable external stresses, including different dynamic load profiles and variable environmental temperatures. Respond analysis in the time and frequency domain is performed to account for the different aging rates under different current loadings, where the statistic calculation and fast Fourier transform are used for the analysis. The empirical model is used to fit the fade curve for the comparisons between constant and variable temperatures. The capacity decrease and internal resistance increase are extracted to evaluate capacity and power fade, respectively. The experimental results show that the urban dynamic operating conditions help to prolong the service life compared to the constant current aging case. In contrast, the aging under the highway profile accelerates the aging process. Although the average temperature is the same as under constant temperature conditions, variable temperature conditions accelerate battery aging.

OriginalsprogEngelsk
TitelAPEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Antal sider5
ForlagIEEE (Institute of Electrical and Electronics Engineers)
Publikationsdato2023
Sider2979-2983
Artikelnummer10131534
ISBN (Elektronisk)9781665475396
DOI
StatusUdgivet - 2023
Begivenhed38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, USA
Varighed: 19 mar. 202323 mar. 2023

Konference

Konference38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Land/OmrådeUSA
ByOrlando
Periode19/03/202323/03/2023
SponsorIEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)
NavnConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Vol/bind2023-March

Bibliografisk note

Publisher Copyright:
© 2023 IEEE.

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