Blind detection and prediction of Multi-SIM UE subframe loss

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

OriginalsprogEngelsk
Titel2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings
Vol/bind2016-July
ForlagIEEE
Publikationsdato2016
Artikelnummer7504148
ISBN (Elektronisk)9781509016983
DOI
StatusUdgivet - 2016
Begivenhed83rd IEEE Vehicular Technology Conference, VTC Spring 2016 - Nanjing, Kina
Varighed: 15 maj 201618 maj 2016

Konference

Konference83rd IEEE Vehicular Technology Conference, VTC Spring 2016
LandKina
ByNanjing
Periode15/05/201618/05/2016

Fingerprint

Base stations
Markov processes
Telecommunication networks
Simulators
Hardware
Costs

Citer dette

Buthler, J. L., & Soerensen, T. (2016). Blind detection and prediction of Multi-SIM UE subframe loss. I 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings (Bind 2016-July). [7504148] IEEE. https://doi.org/10.1109/VTCSpring.2016.7504148
Buthler, Jakob L. ; Soerensen, Troels. / Blind detection and prediction of Multi-SIM UE subframe loss. 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. Bind 2016-July IEEE, 2016.
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Buthler, JL & Soerensen, T 2016, Blind detection and prediction of Multi-SIM UE subframe loss. i 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. bind 2016-July, 7504148, IEEE, Nanjing, Kina, 15/05/2016. https://doi.org/10.1109/VTCSpring.2016.7504148

Blind detection and prediction of Multi-SIM UE subframe loss. / Buthler, Jakob L.; Soerensen, Troels.

2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. Bind 2016-July IEEE, 2016. 7504148.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

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AU - Soerensen, Troels

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DO - 10.1109/VTCSpring.2016.7504148

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Buthler JL, Soerensen T. Blind detection and prediction of Multi-SIM UE subframe loss. I 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. Bind 2016-July. IEEE. 2016. 7504148 https://doi.org/10.1109/VTCSpring.2016.7504148