Condition Monitoring for Capacitors in Modular Multilevel Converter based on High-frequency Transient Analysis

Hongjian Xia, Yi Zhang, Huai Wang, Minyou Chen, Wei Lai, Dan Luo, Yulong Hu

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

3 Citationer (Scopus)

Abstract

Condition monitoring (CM) methods applied for power electronics can provide effective information for predictive maintenance and prevent unexpected system downtime. This paper proposes a non-invasive and in-situ CM method for capacitors in modular multilevel converters. Unlike the conventional methods that monitor low-frequency signals, the proposed method focuses on high-frequency transient analysis. By analyzing the transient voltage at the capacitor's charging moment with wavelet decomposition, the proposed method can estimate the capacitor's equivalent series resistance in situ. Moreover, the proposed method based on high-frequency transients is decoupled from system operating states, while the conventional low-frequency signals are often affected by operations (e.g., loads, environments, etc.). Finally, the effectiveness of the proposed method has been validated in a 14kW case study by simulation.

OriginalsprogEngelsk
Titel2021 IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Proceedings
Antal sider6
ForlagIEEE (Institute of Electrical and Electronics Engineers)
Publikationsdato2021
Sider5342-5347
ISBN (Trykt)978-1-7281-5134-2, 978-1-7281-6128-0
ISBN (Elektronisk)978-1-7281-5135-9
DOI
StatusUdgivet - 2021
Begivenhed13th IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Virtual, Online, Canada
Varighed: 10 okt. 202114 okt. 2021

Konference

Konference13th IEEE Energy Conversion Congress and Exposition, ECCE 2021
Land/OmrådeCanada
ByVirtual, Online
Periode10/10/202114/10/2021
SponsorGMW Associates, IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Opal-RT Technologies, STMicroelectronics
NavnIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

Bibliografisk note

Publisher Copyright:
© 2021 IEEE.

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