Degradation Analysis of Planar Magnetics

Zhan Shen; Qian Wang; Huai Wang

doi:10.1109/APEC39645.2020.9124586

Degradation Analysis of Planar Magnetics

Zhan Shen, Qian Wang, Huai Wang

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

8 Citationer (Scopus)

141 Downloads (Pure)

Abstract

This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are analyzed.
Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.

Originalsprog	Engelsk
Titel	2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider	7
Forlag	IEEE
Publikationsdato	jun. 2020
Sider	2687-2693
Artikelnummer	9124586
ISBN (Elektronisk)	978-1-7281-4829-8
DOI	https://doi.org/10.1109/APEC39645.2020.9124586
Status	Udgivet - jun. 2020
Begivenhed	2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, USA Varighed: 15 mar. 2020 → 19 mar. 2020

Konference

Konference	2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
Land/Område	USA
By	New Orleans, LA
Periode	15/03/2020 → 19/03/2020

Navn	I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN	1048-2334

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10.1109/APEC39645.2020.9124586

APEC Paper Degradation of MagneticsAccepteret manuskript, 7,55 MB

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Citationsformater

@inproceedings{3797fdd75c2241c5bf713e8b23d06c60,

title = "Degradation Analysis of Planar Magnetics",

abstract = "This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are analyzed.Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.",

keywords = "Planar transformer, Magnetic core, winding, Degradation, Lifetime model, Reliability",

author = "Zhan Shen and Qian Wang and Huai Wang",

year = "2020",

month = jun,

doi = "10.1109/APEC39645.2020.9124586",

language = "English",

series = "I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings",

publisher = "IEEE",

pages = "2687--2693",

booktitle = "2020 IEEE Applied Power Electronics Conference and Exposition (APEC)",

address = "United States",

note = "2020 IEEE Applied Power Electronics Conference and Exposition (APEC) ; Conference date: 15-03-2020 Through 19-03-2020",

}

Shen, Z, Wang, Q & Wang, H 2020, Degradation Analysis of Planar Magnetics. i 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)., 9124586, IEEE, I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings, s. 2687-2693, 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), New Orleans, LA, USA, 15/03/2020. https://doi.org/10.1109/APEC39645.2020.9124586

Degradation Analysis of Planar Magnetics. / Shen, Zhan; Wang, Qian; Wang, Huai.
2020 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE, 2020. s. 2687-2693 9124586 (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Degradation Analysis of Planar Magnetics

AU - Shen, Zhan

AU - Wang, Qian

AU - Wang, Huai

PY - 2020/6

Y1 - 2020/6

N2 - This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are analyzed.Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.

AB - This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are analyzed.Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.

KW - Planar transformer

KW - Magnetic core

KW - winding

KW - Degradation

KW - Lifetime model

KW - Reliability

UR - http://www.scopus.com/inward/record.url?scp=85087753523&partnerID=8YFLogxK

U2 - 10.1109/APEC39645.2020.9124586

DO - 10.1109/APEC39645.2020.9124586

M3 - Article in proceeding

T3 - I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings

SP - 2687

EP - 2693

BT - 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

PB - IEEE

T2 - 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

Y2 - 15 March 2020 through 19 March 2020

ER -

Degradation Analysis of Planar Magnetics

Abstract

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