Degradation Analysis of Planar Magnetics

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2 Citationer (Scopus)
61 Downloads (Pure)

Abstrakt

This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are analyzed.
Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.
OriginalsprogEngelsk
Titel2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider7
ForlagIEEE
Publikationsdatojun. 2020
Sider2687-2693
Artikelnummer9124586
ISBN (Elektronisk)978-1-7281-4829-8
DOI
StatusUdgivet - jun. 2020
Begivenhed2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, USA
Varighed: 15 mar. 202019 mar. 2020

Konference

Konference2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
LandUSA
ByNew Orleans, LA
Periode15/03/202019/03/2020
NavnI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

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