Degradation Assessment in IGBT Modules Using Four-Point Probing Approach

Kristian Bonderup Pedersen; Peter Kjær Kristensen; Vladimir Popok; Kjeld Pedersen

doi:10.1109/TPEL.2014.2344174

Degradation Assessment in IGBT Modules Using Four-Point Probing Approach

Kristian Bonderup Pedersen, Peter Kjær Kristensen, Vladimir Popok, Kjeld Pedersen

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

37 Citationer (Scopus)

8 Downloads (Pure)

Abstract

Four-point probing of electrical parameters on various components of IGBT modules is suggested as an approach for the estimation of degradation in stressed devices. By comparison of these parameters for stressed and new components one can evaluate an overall degradation of the module and find out the wear state of individual components. This knowledge can be applied for preventing early failures and for optimization of the device design. The method is presented by regarding a standard type power module subjected to power cycling.

Originalsprog	Engelsk
Tidsskrift	I E E E Transactions on Power Electronics
Vol/bind	30
Udgave nummer	5
Sider (fra-til)	2405-2412
Antal sider	8
ISSN	0885-8993
DOI	https://doi.org/10.1109/TPEL.2014.2344174
Status	Udgivet - maj 2015

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10.1109/TPEL.2014.2344174

http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6872595&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_Publication_Number%3A63%29%26pageNumber%3D5%26rowsPerPage%3D75

AUB Link

Søg efter materialet i Aalborg Universitetsbiblioteks søgemaskine

Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Projekter: Projekt › Forskning

Citationsformater

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abstract = "Four-point probing of electrical parameters on various components of IGBT modules is suggested as an approach for the estimation of degradation in stressed devices. By comparison of these parameters for stressed and new components one can evaluate an overall degradation of the module and find out the wear state of individual components. This knowledge can be applied for preventing early failures and for optimization of the device design. The method is presented by regarding a standard type power module subjected to power cycling.",

keywords = "Four-point probing, interconnections, physics of failure, power modules, thermo-mechanical degradation",

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AU - Popok, Vladimir

AU - Pedersen, Kjeld

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AB - Four-point probing of electrical parameters on various components of IGBT modules is suggested as an approach for the estimation of degradation in stressed devices. By comparison of these parameters for stressed and new components one can evaluate an overall degradation of the module and find out the wear state of individual components. This knowledge can be applied for preventing early failures and for optimization of the device design. The method is presented by regarding a standard type power module subjected to power cycling.

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Degradation Assessment in IGBT Modules Using Four-Point Probing Approach

Abstract

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Center Of Reliable Power Electronics (CORPE)

Citationsformater