Digital Twin-based and Machine Learning-assisted GaN Power Module Packaging Reliability Analysis Method

CoDE: Center of Digitalized Electronics (CoDE)

Munk-Nielsen, S. (PI (principal investigator)), Jørgensen, A. B. (CoPI), Uhrenfeldt, C. (CoPI), Beczkowski, S. M. (Projektdeltager), Ahmad, F. (Projektdeltager), Meinert, J. D. (Projektdeltager), Kubulus, P. P. (Projektdeltager), Takahashi, M. (Projektdeltager), Sun, Z. (Projektdeltager), Wang, R. (Projektdeltager), Gao, Y. (Projektdeltager), Zäch, M. R. (Projektdeltager), Meyer, S. (Projektdeltager), Liccardi, S. (Projektdeltager), Kristensen, N. H. (Projektdeltager) & Steffensen, B. (Projektkoordinator)

Poul Due Jensens Fond

01/01/2021 → 31/12/2026

Projekter: Projekt › Forskning

Digital Twin-based and Machine Learning-assisted GaN Power Module Packaging Reliability Analysis Method

Sun, Z. (PI (principal investigator)), Munk-Nielsen, S. (Supervisor), Uhrenfeldt, C. (Supervisor) & Jørgensen, A. B. (Supervisor)

01/12/2021 → 31/05/2025

Projekter: Projekt › Ph.d.-projekt