Effects of rescaling bilinear interpolant on image interpolation quality

Olivier Rukundo, Samuel Schmidt

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Rescaling bilinear (RB) interpolant’s pixels is a novel image interpolation scheme. In the current study, we investigate the effects on the quality of interpolated images. RB determines the lower and upper bounds using the standard deviation of the four nearest pixels to find the new interval or range that will be used to rescale the bilinear interpolant’s pixels. The products of the rescaled-pixels and corresponding distance-based-weights are added to estimate the new pixel value, to be assigned at the empty locations of the destination image. Effects of RB on image interpolation quality were investigated using standard full-reference and non-reference objective image quality metrics, particularly those focusing on interpolated images features and distortion similarities. Furthermore, variance and mean based metrics were also employed to further investigate the effects in terms of contrast and intensity increment or decrement. The Matlab based simulations demonstrated generally superior performances of RB compared to the traditional bilinear (TB) interpolation algorithm. The studied scheme’s major drawback was a higher processing time and tendency to rely on the image type and/or specific interpolation scaling ratio to achieve superior performances. Potential applications of rescaling based bilinear interpolation may also include ultrasound scan conversion in cardiac ultrasound, endoscopic ultrasound, etc.
TitelOptoelectronic Imaging and Multimedia Technology V : Proceedings of SPIE
Antal sider11
ForlagSPIE - International Society for Optical Engineering
Publikationsdato2 nov. 2018
ISBN (Trykt)9781510622326
ISBN (Elektronisk)9781510622333
StatusUdgivet - 2 nov. 2018
BegivenhedSPIE/COS Photonics Asia : Optoelectronic Imaging and Multimedia Technology V - Beijing International Convention Center, Beijing, Kina
Varighed: 11 okt. 201813 okt. 2018


KonferenceSPIE/COS Photonics Asia
LokationBeijing International Convention Center
NavnProceedings of SPIE, the International Society for Optical Engineering

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