Electrical Parasitics and Thermal Modeling for Optimized Layout Design of High Power SiC Modules

Amir Sajjad Bahman, Frede Blaabjerg, Atanu Dutta, Alan Mantooth

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11 Citationer (Scopus)
866 Downloads (Pure)

Abstrakt

The reliability of power modules is closely depended on their electrical and thermal behavior in operation. As power modules are built to operate more integrated and faster, the electrical parasitic and thermal stress issues become more critical. This paper investigates simplified thermal and parasitic inductance models of SiC power modules. These models can replace the models by Finite Element Methods (FEM) to predict temperatures and electrical parasitics of power modules with much faster speed and acceptable errors and will be used for study of real operation of power modules. As a case study, the presented models are verified by a conventional and an optimized power module layout. The optimized layout is designed based on the reduction of stray inductance and temperature in a P-cell and N-cell half-bridge module. The presented models are verified by
FEM simulations and also experiment.
OriginalsprogEngelsk
TitelProceedings of the 31st Annual IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider8
ForlagIEEE
Publikationsdatomar. 2016
Sider3012 - 3019
ISBN (Trykt)978-1-4673-8393-6, 978-1-4673-9551-9
ISBN (Elektronisk)978-1-4673-9550-2
DOI
StatusUdgivet - mar. 2016
Begivenhed2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Long Beach Convention and Entertainment Center, Long Beach, USA
Varighed: 20 mar. 201624 mar. 2016
http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=32616

Konference

Konference2016 IEEE Applied Power Electronics Conference and Exposition (APEC)
LokationLong Beach Convention and Entertainment Center
LandUSA
ByLong Beach
Periode20/03/201624/03/2016
Internetadresse

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