Electronic properties of thin films sublimed from La@C82 and Li@C60

Vladimir Popok; A.V. Gromov; Martin Jonsson; A. Taninaka; H. Shinohara; Eleanor E.B. Campbell

doi:10.1142/S1793292008000988

Electronic properties of thin films sublimed from La@C82 and Li@C60

Vladimir Popok, A.V. Gromov, Martin Jonsson, A. Taninaka, H. Shinohara, Eleanor E.B. Campbell

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

3 Citationer (Scopus)

Abstract

La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.

Originalsprog	Engelsk
Tidsskrift	Nano
Vol/bind	3
Udgave nummer	3
Sider (fra-til)	155-160
Antal sider	6
ISSN	1793-2920
DOI	https://doi.org/10.1142/S1793292008000988
Status	Udgivet - jun. 2008
Udgivet eksternt	Ja

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title = "Electronic properties of thin films sublimed from La@C82 and Li@C60",

abstract = "La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed. ",

keywords = "Endohedral metallofullerenes , electronic transport , atomic force microscopy",

author = "Vladimir Popok and A.V. Gromov and Martin Jonsson and A. Taninaka and H. Shinohara and Campbell, {Eleanor E.B.}",

year = "2008",

month = jun,

doi = "10.1142/S1793292008000988",

language = "English",

volume = "3",

pages = "155--160",

journal = "Nano",

issn = "1793-2920",

publisher = "World Scientific",

number = "3",

}

TY - JOUR

T1 - Electronic properties of thin films sublimed from La@C82 and Li@C60

AU - Popok, Vladimir

AU - Gromov, A.V.

AU - Jonsson, Martin

AU - Taninaka, A.

AU - Shinohara, H.

AU - Campbell, Eleanor E.B.

PY - 2008/6

Y1 - 2008/6

N2 - La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.

AB - La@C82 and Li@C60 thin films are studied using four-probe current-voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behaviour of both films with room-temperature resistivity of 21+-8 and 1230+-50 Ohm.cm for the La@C82 and Li@C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li@C60 film structure increasing the film resistivity to values typical for C60 are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.

KW - Endohedral metallofullerenes

KW - electronic transport

KW - atomic force microscopy

U2 - 10.1142/S1793292008000988

DO - 10.1142/S1793292008000988

M3 - Journal article

SN - 1793-2920

VL - 3

SP - 155

EP - 160

JO - Nano

JF - Nano

IS - 3

ER -

Electronic properties of thin films sublimed from La@C82 and Li@C60

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