Exploring the Limits: Applying State-of-the-Art Stereo Matching Algorithms to Rectified Ultra-Wide Stereo

Filip Slezák*, Morten S. Laursen, Thomas B. Moeslund

*Kontaktforfatter

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Abstract

Stereo cameras leveraging two-view geometry have predominantly focused on narrow field-of-view rectified stereo using the pinhole camera model. This research trend overlooks the complexities and potential of wide-angle stereo systems, which necessitate the use of wide-angle fisheye optics that can not be well approximated by pinhole camera model. Consequently, a lack of standardized form leads researchers to explore various strategies. Currently, a dichotomy exists between utilizing raw images directly or rectifying them. Wide-angle stereo rectification opens the potential to reuse the latest state-of-the-art (SOTA) algorithms designed for pinhole rectified stereo as a black box. However, rectification comes at the cost of severe distortions throughout the image and non-linear triangulation of 3D structure. The literature currently lacks a thorough examination of the implications of these distortions and the impact of applying the latest SOTA algorithms to stereo-rectified wide-angle images. Our work addresses this gap by conducting an exhaustive analysis of the wide-angle rectified stereo framework, delivering concrete recommendations for developing accurate wide-angle stereo systems.

OriginalsprogEngelsk
TitelProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Antal sider10
ForlagIEEE (Institute of Electrical and Electronics Engineers)
Publikationsdato2024
Sider1335-1344
ISBN (Trykt)979-8-3503-6548-1
ISBN (Elektronisk)9798350365474
DOI
StatusUdgivet - 2024
Begivenhed2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, USA
Varighed: 16 jun. 202422 jun. 2024

Konference

Konference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Land/OmrådeUSA
BySeattle
Periode16/06/202422/06/2024
NavnIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN2160-7508

Bibliografisk note

Publisher Copyright:
© 2024 IEEE.

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