Abstract
Stereo cameras leveraging two-view geometry have predominantly focused on narrow field-of-view rectified stereo using the pinhole camera model. This research trend overlooks the complexities and potential of wide-angle stereo systems, which necessitate the use of wide-angle fisheye optics that can not be well approximated by pinhole camera model. Consequently, a lack of standardized form leads researchers to explore various strategies. Currently, a dichotomy exists between utilizing raw images directly or rectifying them. Wide-angle stereo rectification opens the potential to reuse the latest state-of-the-art (SOTA) algorithms designed for pinhole rectified stereo as a black box. However, rectification comes at the cost of severe distortions throughout the image and non-linear triangulation of 3D structure. The literature currently lacks a thorough examination of the implications of these distortions and the impact of applying the latest SOTA algorithms to stereo-rectified wide-angle images. Our work addresses this gap by conducting an exhaustive analysis of the wide-angle rectified stereo framework, delivering concrete recommendations for developing accurate wide-angle stereo systems.
| Originalsprog | Engelsk |
|---|---|
| Titel | Proceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 |
| Antal sider | 10 |
| Forlag | IEEE (Institute of Electrical and Electronics Engineers) |
| Publikationsdato | 2024 |
| Sider | 1335-1344 |
| ISBN (Trykt) | 979-8-3503-6548-1 |
| ISBN (Elektronisk) | 9798350365474 |
| DOI | |
| Status | Udgivet - 2024 |
| Begivenhed | 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, USA Varighed: 16 jun. 2024 → 22 jun. 2024 |
Konference
| Konference | 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 |
|---|---|
| Land/Område | USA |
| By | Seattle |
| Periode | 16/06/2024 → 22/06/2024 |
| Navn | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
|---|---|
| ISSN | 2160-7508 |
Bibliografisk note
Publisher Copyright:© 2024 IEEE.