Fast visual part inspection for bin picking

Nikolaos Rofalis, Anders S. Olesen, Michael Linde Jakobsen, Volker Kruger

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

Originalsprog	Engelsk
Titel	IST 2016 - 2016 IEEE International Conference on Imaging Systems and Techniques, Proceedings
Antal sider	6
Forlag	IEEE
Publikationsdato	7 nov. 2016
Sider	412-417
ISBN (Elektronisk)	978-1-5090-1817-8
DOI	https://doi.org/10.1109/IST.2016.7738261
Status	Udgivet - 7 nov. 2016
Begivenhed	IEEE International Conference on Imaging Systems and Techniques - Chania, Grækenland Varighed: 4 okt. 2016 → 6 okt. 2016 http://ist2016.ieee-ims.org/

Konference	IEEE International Conference on Imaging Systems and Techniques
Land/Område	Grækenland
By	Chania
Periode	04/10/2016 → 06/10/2016
Internetadresse	http://ist2016.ieee-ims.org/

Adgang til dokumentet

@inproceedings{855f76e1fccf40158658ccdc5da14bed,

title = "Fast visual part inspection for bin picking",

author = "Nikolaos Rofalis and Olesen, {Anders S.} and Jakobsen, {Michael Linde} and Volker Kruger",

year = "2016",

month = nov,

day = "7",

doi = "10.1109/IST.2016.7738261",

language = "English",

pages = "412--417",

booktitle = "IST 2016 - 2016 IEEE International Conference on Imaging Systems and Techniques, Proceedings",

publisher = "IEEE",

address = "United States",

note = "IEEE International Conference on Imaging Systems and Techniques, IEEE IST ; Conference date: 04-10-2016 Through 06-10-2016",

url = "http://ist2016.ieee-ims.org/",

}

TY - GEN

T1 - Fast visual part inspection for bin picking

AU - Rofalis, Nikolaos

AU - Olesen, Anders S.

AU - Jakobsen, Michael Linde

AU - Kruger, Volker

PY - 2016/11/7

Y1 - 2016/11/7

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U2 - 10.1109/IST.2016.7738261

DO - 10.1109/IST.2016.7738261

M3 - Article in proceeding

AN - SCOPUS:85003955359

SP - 412

EP - 417

BT - IST 2016 - 2016 IEEE International Conference on Imaging Systems and Techniques, Proceedings

PB - IEEE

T2 - IEEE International Conference on Imaging Systems and Techniques

Y2 - 4 October 2016 through 6 October 2016

ER -