Fault location in microgrids: A communication-based high-frequency impedance approach

Siavash Beheshtaein*, Robert Cuzner, Mehdi Savaghebi, Saeed Golestan, Josep M. Guerrero

*Kontaktforfatter

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2 Citationer (Scopus)
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Resumé

This paper proposes a novel method to locate faults in an AC-meshed microgrid. To this end, a set of features is first extracted and selected from the measured signals and fed to a Support Vector Machine (SVM) to detect the occurrence of fault. Then, the Distributed Generator (DG) with the lowest amount of fundamental voltage, which is the closest one to the fault, injects an appropriate voltage/current harmonic. As the faulted section has the lowest impedance value from the Point of Common Coupling of the DG, the harmonic current of the corresponding line has the highest value. Based on this fact, the first candidate DG sends a notification signal to the second candidate DG, in which the fault occurs between them. Finally, the impedances in the injected frequency are measured from these two DGs and fed into a multi-class SVM to locate the faulted line. The proposed method has the ability to locate faults for islanded and grid-connected microgrids with variable configurations. Real-time simulation results are taken by OPAL-RT to show the effectiveness of the proposed method in the meshed microgrid.
OriginalsprogEngelsk
TidsskriftIET Generation, Transmission and Distribution
Vol/bind13
Udgave nummer8
Sider (fra-til)1229-1237
Antal sider9
ISSN1751-8687
StatusUdgivet - apr. 2019

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Electric fault location
Support vector machines
Communication
Electric potential

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@article{e5653c445b344a81a9a0a6b98799a609,
title = "Fault location in microgrids: A communication-based high-frequency impedance approach",
abstract = "This paper proposes a novel method to locate faults in an AC-meshed microgrid. To this end, a set of features is first extracted and selected from the measured signals and fed to a Support Vector Machine (SVM) to detect the occurrence of fault. Then, the Distributed Generator (DG) with the lowest amount of fundamental voltage, which is the closest one to the fault, injects an appropriate voltage/current harmonic. As the faulted section has the lowest impedance value from the Point of Common Coupling of the DG, the harmonic current of the corresponding line has the highest value. Based on this fact, the first candidate DG sends a notification signal to the second candidate DG, in which the fault occurs between them. Finally, the impedances in the injected frequency are measured from these two DGs and fed into a multi-class SVM to locate the faulted line. The proposed method has the ability to locate faults for islanded and grid-connected microgrids with variable configurations. Real-time simulation results are taken by OPAL-RT to show the effectiveness of the proposed method in the meshed microgrid.",
keywords = "Distribution Generations, Fault location, Microgrids, Protection",
author = "Siavash Beheshtaein and Robert Cuzner and Mehdi Savaghebi and Saeed Golestan and Guerrero, {Josep M.}",
year = "2019",
month = "4",
language = "English",
volume = "13",
pages = "1229--1237",
journal = "IET Generation, Transmission & Distribution",
issn = "1751-8687",
publisher = "Institution of Engineering and Technology",
number = "8",

}

Fault location in microgrids: A communication-based high-frequency impedance approach. / Beheshtaein, Siavash; Cuzner, Robert; Savaghebi, Mehdi; Golestan, Saeed; Guerrero, Josep M.

I: IET Generation, Transmission and Distribution, Bind 13, Nr. 8, 04.2019, s. 1229-1237.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Fault location in microgrids: A communication-based high-frequency impedance approach

AU - Beheshtaein, Siavash

AU - Cuzner, Robert

AU - Savaghebi, Mehdi

AU - Golestan, Saeed

AU - Guerrero, Josep M.

PY - 2019/4

Y1 - 2019/4

N2 - This paper proposes a novel method to locate faults in an AC-meshed microgrid. To this end, a set of features is first extracted and selected from the measured signals and fed to a Support Vector Machine (SVM) to detect the occurrence of fault. Then, the Distributed Generator (DG) with the lowest amount of fundamental voltage, which is the closest one to the fault, injects an appropriate voltage/current harmonic. As the faulted section has the lowest impedance value from the Point of Common Coupling of the DG, the harmonic current of the corresponding line has the highest value. Based on this fact, the first candidate DG sends a notification signal to the second candidate DG, in which the fault occurs between them. Finally, the impedances in the injected frequency are measured from these two DGs and fed into a multi-class SVM to locate the faulted line. The proposed method has the ability to locate faults for islanded and grid-connected microgrids with variable configurations. Real-time simulation results are taken by OPAL-RT to show the effectiveness of the proposed method in the meshed microgrid.

AB - This paper proposes a novel method to locate faults in an AC-meshed microgrid. To this end, a set of features is first extracted and selected from the measured signals and fed to a Support Vector Machine (SVM) to detect the occurrence of fault. Then, the Distributed Generator (DG) with the lowest amount of fundamental voltage, which is the closest one to the fault, injects an appropriate voltage/current harmonic. As the faulted section has the lowest impedance value from the Point of Common Coupling of the DG, the harmonic current of the corresponding line has the highest value. Based on this fact, the first candidate DG sends a notification signal to the second candidate DG, in which the fault occurs between them. Finally, the impedances in the injected frequency are measured from these two DGs and fed into a multi-class SVM to locate the faulted line. The proposed method has the ability to locate faults for islanded and grid-connected microgrids with variable configurations. Real-time simulation results are taken by OPAL-RT to show the effectiveness of the proposed method in the meshed microgrid.

KW - Distribution Generations

KW - Fault location

KW - Microgrids

KW - Protection

UR - http://www.scopus.com/inward/record.url?scp=85065229653&partnerID=8YFLogxK

M3 - Journal article

VL - 13

SP - 1229

EP - 1237

JO - IET Generation, Transmission & Distribution

JF - IET Generation, Transmission & Distribution

SN - 1751-8687

IS - 8

ER -