Projekter pr. år
Abstract
In respect to a Doubly-Fed Induction Generator (DFIG) system, its corresponding time scale varies from microsecond level of power semiconductor switching to second level of the mechanical response. In order to map annual thermal profile of the power semiconductors, different approaches have been adopted to handle the fundamental-frequency thermal cycles and load-varying thermal cycles. Their effects on lifetime estimation of the power device in the Back-to-Back (BTB) power converter are evaluated.
Originalsprog | Engelsk |
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Tidsskrift | Microelectronics Reliability |
Vol/bind | 76-77 |
Sider (fra-til) | 549-555 |
Antal sider | 7 |
ISSN | 0026-2714 |
DOI | |
Status | Udgivet - sep. 2017 |
Begivenhed | 28th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) - Bordeaux, Frankrig Varighed: 25 sep. 2017 → 28 sep. 2017 |
Konference
Konference | 28th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) |
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Land/Område | Frankrig |
By | Bordeaux |
Periode | 25/09/2017 → 28/09/2017 |
Fingeraftryk
Dyk ned i forskningsemnerne om 'Fundamental-frequency and load-varying thermal cycles effects on lifetime estimation of DFIG power converter'. Sammen danner de et unikt fingeraftryk.Projekter
- 1 Afsluttet
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APETT: Advanced Power Electronic Technology and Tools
Blaabjerg, F., Munk-Nielsen, S., Iannuzzo, F., Wang, H., Uhrenfeldt, C., Beczkowski, S. M., Zhou, D., Choi, U., Jørgensen, A. B., Vernica, I., Sangwongwanich, A., Christensen, N., Ceccarelli, L., Nielsen, C. K., Bahman, A. S., Pedersen, K., Pedersen, K. B. & Kristensen, P. K.
01/01/2017 → 30/06/2021
Projekter: Projekt › Forskning