Fuse Modeling for Reliability Study of Power Electronic Circuits

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Resumé

This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.
OriginalsprogEngelsk
TitelProceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider8
ForlagIEEE Press
Publikationsdatomar. 2017
Sider829-836
ISBN (Trykt)978-1-5090-5366-7
DOI
StatusUdgivet - mar. 2017
Begivenhed2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa Convention Center, Tampa, FL, USA
Varighed: 26 mar. 201730 mar. 2017

Konference

Konference2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
LokationTampa Convention Center
LandUSA
ByTampa, FL
Periode26/03/201730/03/2017
NavnIEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN2470-6647

Fingerprint

Electric fuses
Power electronics
Networks (circuits)
Temperature
Wear of materials
Fatigue of materials
Finite element method
Electric potential

Citer dette

Bahman, A. S., Iannuzzo, F., & Blaabjerg, F. (2017). Fuse Modeling for Reliability Study of Power Electronic Circuits. I Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) (s. 829-836). IEEE Press. IEEE Applied Power Electronics Conference and Exposition (APEC) https://doi.org/10.1109/APEC.2017.7930792
Bahman, Amir Sajjad ; Iannuzzo, Francesco ; Blaabjerg, Frede. / Fuse Modeling for Reliability Study of Power Electronic Circuits. Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE Press, 2017. s. 829-836 (IEEE Applied Power Electronics Conference and Exposition (APEC)).
@inproceedings{ae52e5e648de4cb7b1534705c176a617,
title = "Fuse Modeling for Reliability Study of Power Electronic Circuits",
abstract = "This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.",
keywords = "Fatique, Finite element method, Fuse, Thermal stress, Reliability",
author = "Bahman, {Amir Sajjad} and Francesco Iannuzzo and Frede Blaabjerg",
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doi = "10.1109/APEC.2017.7930792",
language = "English",
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Bahman, AS, Iannuzzo, F & Blaabjerg, F 2017, Fuse Modeling for Reliability Study of Power Electronic Circuits. i Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE Press, IEEE Applied Power Electronics Conference and Exposition (APEC), s. 829-836, Tampa, FL, USA, 26/03/2017. https://doi.org/10.1109/APEC.2017.7930792

Fuse Modeling for Reliability Study of Power Electronic Circuits. / Bahman, Amir Sajjad; Iannuzzo, Francesco; Blaabjerg, Frede.

Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE Press, 2017. s. 829-836 (IEEE Applied Power Electronics Conference and Exposition (APEC)).

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

TY - GEN

T1 - Fuse Modeling for Reliability Study of Power Electronic Circuits

AU - Bahman, Amir Sajjad

AU - Iannuzzo, Francesco

AU - Blaabjerg, Frede

PY - 2017/3

Y1 - 2017/3

N2 - This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.

AB - This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.

KW - Fatique

KW - Finite element method

KW - Fuse

KW - Thermal stress

KW - Reliability

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DO - 10.1109/APEC.2017.7930792

M3 - Article in proceeding

SN - 978-1-5090-5366-7

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BT - Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)

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Bahman AS, Iannuzzo F, Blaabjerg F. Fuse Modeling for Reliability Study of Power Electronic Circuits. I Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE Press. 2017. s. 829-836. (IEEE Applied Power Electronics Conference and Exposition (APEC)). https://doi.org/10.1109/APEC.2017.7930792