General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements

Troels Emil Kolding

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskning

OriginalsprogEngelsk
TitelIEEE MTT-S International Microwave Symposium Digest (IMS), Boston, Massachusetts, USA, June 2000
Publikationsdato1996
Sider1839-1842
StatusUdgivet - 1996
BegivenhedGeneral Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements -
Varighed: 19 maj 2010 → …

Konference

KonferenceGeneral Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements
Periode19/05/2010 → …

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