@inproceedings{67b0b2c8bf694ae199f4f0cb77fec69e,
title = "Gradient-based End-of-life Criterion of Power Semiconductor Modules",
abstract = "This paper proposes a gradient-based End-of-Life (EOL) criterion with the application example in power semicon-ductor modules. The widely used criterion to determine the EOL of IGBTs in power cycling test is certain percentage of increase of the on-state voltage. Nevertheless, it suffers from significant inconsistency among testing samples in the EOL-based cycle-to-failure with respect to its actual cycle-to-failure considering the thermal limit, that is, the cycle-to-failure margin. The proposed EOL criterion is based on the evolution of the change rate of the on-state voltage, which shows much more consistent cycle-to-failure margins. Experimental case studies demonstrate the application of the proposed EOL criterion and its advantages.",
keywords = "degradation, end-of-life criterion, gradient, power semiconductor modules, power cycling test, reliability",
author = "Yichi Zhang and Yi Zhang and Yao Bo and Shuai Zhao and Huai Wang",
year = "2023",
month = mar,
day = "19",
doi = "10.1109/APEC43580.2023.10131296",
language = "English",
isbn = "978-1-6654-7540-2",
series = "I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings",
publisher = "IEEE (Institute of Electrical and Electronics Engineers)",
pages = "1167--1171",
booktitle = "APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition",
address = "United States",
note = "38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 ; Conference date: 19-03-2023 Through 23-03-2023",
}