1 Citationer (Scopus)
30 Downloads (Pure)

Abstract

This paper proposes a gradient-based End-of-Life (EOL) criterion with the application example in power semicon-ductor modules. The widely used criterion to determine the EOL of IGBTs in power cycling test is certain percentage of increase of the on-state voltage. Nevertheless, it suffers from significant inconsistency among testing samples in the EOL-based cycle-to-failure with respect to its actual cycle-to-failure considering the thermal limit, that is, the cycle-to-failure margin. The proposed EOL criterion is based on the evolution of the change rate of the on-state voltage, which shows much more consistent cycle-to-failure margins. Experimental case studies demonstrate the application of the proposed EOL criterion and its advantages.
OriginalsprogEngelsk
TitelAPEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Antal sider5
ForlagIEEE
Publikationsdato19 mar. 2023
Sider1167-1171
Artikelnummer10131296
ISBN (Trykt)978-1-6654-7540-2
ISBN (Elektronisk)978-1-6654-7539-6
DOI
StatusUdgivet - 19 mar. 2023
Begivenhed38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, USA
Varighed: 19 mar. 202323 mar. 2023

Konference

Konference38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Land/OmrådeUSA
ByOrlando
Periode19/03/202323/03/2023
SponsorIEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)
NavnI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

Fingeraftryk

Dyk ned i forskningsemnerne om 'Gradient-based End-of-life Criterion of Power Semiconductor Modules'. Sammen danner de et unikt fingeraftryk.

Citationsformater