Projekter pr. år
Abstract
The structural optimization of power modules for reliability can be performed without physical prototyping if the structural weakness in modules can be assessed on a 3D model. In this study, 3D thermal stress simulation is investigated as a predictive tool for the heat cycle test (R CT) failure point of the medium voltage power module. The module has a multi- layer structure of two different ceramics (A12O3 and AIN) to reduce the parasitic capacitance. In this complex structured module, the failure point of actual test samples are shown to coincide with weakness points of the thermo-mechanical stress in the 3D simulation. The heat cycle test (125/-40°C) was used for simulation and testing. The failure point of the module was predominantly copper delamination from the AIN substrate surface after HCT 100 cycles. The delaminated locations were matched to points in the simulation that has 2 characteristics, high peeling stresses points and high shape deformation of copper pattern at the simulation results. This observation applies to copper patterns only connected to the ceramics, while copper patterns connected to other adjacent layers did not follow this trend.
Originalsprog | Engelsk |
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Titel | 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) |
Antal sider | 8 |
Forlag | IEEE (Institute of Electrical and Electronics Engineers) |
Publikationsdato | 19 mar. 2023 |
Sider | 2668-2675 |
Artikelnummer | 10131157 |
ISBN (Trykt) | 978-1-6654-7540-2 |
ISBN (Elektronisk) | 978-1-6654-7539-6 |
DOI | |
Status | Udgivet - 19 mar. 2023 |
Begivenhed | 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, USA Varighed: 19 mar. 2023 → 23 mar. 2023 |
Konference
Konference | 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 |
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Land/Område | USA |
By | Orlando |
Periode | 19/03/2023 → 23/03/2023 |
Sponsor | IEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA) |
Navn | IEEE Applied Power Electronics Conference and Exposition (APEC) |
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ISSN | 1048-2334 |
Fingeraftryk
Dyk ned i forskningsemnerne om 'Heat cycle failure point prediction by 3D thermal stress analysis for medium voltage power module'. Sammen danner de et unikt fingeraftryk.-
CoDE: Center of Digitalized Electronics (CoDE)
Munk-Nielsen, S. (PI (principal investigator)), Jørgensen, A. B. (CoPI), Uhrenfeldt, C. (CoPI), Beczkowski, S. (Projektdeltager), Ahmad, F. (Projektdeltager), Meinert, J. D. (Projektdeltager), Kubulus, P. P. (Projektdeltager), Takahashi, M. (Projektdeltager), Sun, Z. (Projektdeltager), Wang, R. (Projektdeltager), Gao, Y. (Projektdeltager), Zäch, M. R. (Projektdeltager), Meyer, S. (Projektdeltager), Liccardi, S. (Projektdeltager), Kristensen, N. H. (Projektdeltager) & Steffensen, B. (Projektkoordinator)
01/01/2021 → 31/12/2026
Projekter: Projekt › Forskning
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Developing the Novel Reliability Design Method with 3D-simulation of SiC Power Module
Takahashi, M. (PI (principal investigator)), Uhrenfeldt, C. (Supervisor), Munk-Nielsen, S. (Supervisor) & Jørgensen, A. B. (Supervisor)
01/10/2021 → 30/09/2024
Projekter: Projekt › Ph.d.-projekt
Priser
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APEC 2023 Outstanding poster award
Takahashi, M. (Modtager), Jørgensen, J. K. (Modtager), Jørgensen, A. B. (Modtager), Munk-Nielsen, S. (Modtager) & Uhrenfeldt, C. (Modtager), 23 mar. 2023
Pris: Konferencepriser