Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications

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Resumé

Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.
OriginalsprogEngelsk
TitelProceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018)
Antal sider8
Udgivelses stedUSA
ForlagIEEE Press
Publikationsdatosep. 2018
Sider4078 - 4085
ISBN (Trykt)978-1-4799-7313-2
ISBN (Elektronisk)978-1-4799-7312-5
DOI
StatusUdgivet - sep. 2018
Begivenhed 2018 IEEE Energy Conversion Congress and Exposition: ECCE - Portland, USA
Varighed: 23 sep. 201827 sep. 2018

Konference

Konference 2018 IEEE Energy Conversion Congress and Exposition
LandUSA
ByPortland
Periode23/09/201827/09/2018
NavnIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

Fingerprint

Power electronics
Sampling
Uncertainty analysis
Insulated gate bipolar transistors (IGBT)
Data structures
Capacitors
Costs

Citer dette

Vernica, I., Wang, H., & Blaabjerg, F. (2018). Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications. I Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018) (s. 4078 - 4085). USA: IEEE Press. IEEE Energy Conversion Congress and Exposition https://doi.org/10.1109/ECCE.2018.8558092
Vernica, Ionut ; Wang, Huai ; Blaabjerg, Frede. / Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications. Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018). USA : IEEE Press, 2018. s. 4078 - 4085 (IEEE Energy Conversion Congress and Exposition).
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title = "Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications",
abstract = "Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.",
keywords = "Mission profile resolution, Power IGBT module, DC-link capacitor, System-level reliability, Uncertainty analysis",
author = "Ionut Vernica and Huai Wang and Frede Blaabjerg",
year = "2018",
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doi = "10.1109/ECCE.2018.8558092",
language = "English",
isbn = "978-1-4799-7313-2",
series = "IEEE Energy Conversion Congress and Exposition",
pages = "4078 -- 4085",
booktitle = "Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018)",
publisher = "IEEE Press",

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Vernica, I, Wang, H & Blaabjerg, F 2018, Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications. i Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018). IEEE Press, USA, IEEE Energy Conversion Congress and Exposition, s. 4078 - 4085, Portland, USA, 23/09/2018. https://doi.org/10.1109/ECCE.2018.8558092

Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications. / Vernica, Ionut; Wang, Huai; Blaabjerg, Frede.

Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018). USA : IEEE Press, 2018. s. 4078 - 4085 (IEEE Energy Conversion Congress and Exposition).

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

TY - GEN

T1 - Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications

AU - Vernica, Ionut

AU - Wang, Huai

AU - Blaabjerg, Frede

PY - 2018/9

Y1 - 2018/9

N2 - Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.

AB - Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.

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DO - 10.1109/ECCE.2018.8558092

M3 - Article in proceeding

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Vernica I, Wang H, Blaabjerg F. Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications. I Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018). USA: IEEE Press. 2018. s. 4078 - 4085. (IEEE Energy Conversion Congress and Exposition). https://doi.org/10.1109/ECCE.2018.8558092