Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications

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9 Citationer (Scopus)
284 Downloads (Pure)

Abstrakt

Due to the increased cost, and time-demanding approach of conventional reliability improvement procedures, the transition towards model-based reliability assessment of power electronics becomes more and more crucial. Although important steps have been taken in this direction, the resulting lifetime prediction is still subject to different assumptions and uncertainties (e.g. mission profile data, modeling errors, lifetime models, etc.), Thus, this paper aims at investigating and quantifying the impact of the mission profile resolution on the reliability estimation of power IGBT modules and DC-link capacitors. For a 10 kW PV application case study, three mission profile sampling rates (1 minute/data, 30 minutes/data, and 60 minutes/data) are considered and benchmarked, with respect to the predicted lifetime of the power electronic components/system. Finally, an uncertainty analysis is performed for the resulting reliability metrics, and some initial guidelines for mission profile resolution selection are provided.
OriginalsprogEngelsk
TitelProceedings of the IEEE Energy Conversion Congress and Exposition (ECCE 2018)
Antal sider8
UdgivelsesstedUSA
ForlagIEEE Press
Publikationsdatosep. 2018
Sider4078 - 4085
ISBN (Trykt)978-1-4799-7313-2
ISBN (Elektronisk)978-1-4799-7312-5
DOI
StatusUdgivet - sep. 2018
Begivenhed 2018 IEEE Energy Conversion Congress and Exposition: ECCE - Portland, USA
Varighed: 23 sep. 201827 sep. 2018

Konference

Konference 2018 IEEE Energy Conversion Congress and Exposition
Land/OmrådeUSA
ByPortland
Periode23/09/201827/09/2018
NavnIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

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