Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

He Du

Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

He Du

Publikation: Ph.d.-afhandling

307 Downloads (Pure)

Originalsprog	Engelsk
Vejledere	Iannuzzo, Francesco, Hovedvejleder Reigosa, Paula Diaz, Bivejleder, Ekstern person
Udgiver	Aalborg Universitetsforlag
ISBN'er, elektronisk	978-87-7210-841-4
Status	Udgivet - 2020

Bibliografisk note

PhD supervisor:
Prof. Francesco Iannuzzo, Aalborg University, Denmark

Assistant PhD supervisor:
Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland

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PHD_HD_E-pdfForlagets udgivne version, 14,2 MB

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4 Konferenceartikel i proceeding
4 Tidsskriftartikel
1 Konferenceartikel i tidsskrift

A Mitigation Strategy for the Short-Circuit Degradation in SiC MOSFETs
Du, H. & Iannuzzo, F., 2020, IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia 2020. IEEE, s. 1-4 4 s. 9360256
Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

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3 Citationer (Scopus)

46 Downloads (Pure)
Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis
Du, H., Letz, S., Baker, N., Goetz, T., Iannuzzo, F. & Schletz, A., nov. 2020, I: Microelectronics Reliability. 114, s. 1-5 5 s., 113784.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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10 Citationer (Scopus)

57 Downloads (Pure)
Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence
Du, H., Reigosa, P. D., Ceccarelli, L. & Iannuzzo, F., mar. 2020, I: IEEE Journal of Emerging and Selected Topics in Power Electronics. 8, 1, s. 195-205 11 s., 8844745.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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34 Citationer (Scopus)

291 Downloads (Pure)

Citationsformater

@misc{265d050799a44f9183da97084a85bb79,

title = "Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy",

keywords = "Silicon Carbide, Power MOSFET, Reliability, Short-Circuit, Failure Analysis, Power Cycling, Remaining Useful Life, Degradation",

author = "He Du",

note = "PhD supervisor: Prof. Francesco Iannuzzo, Aalborg University, Denmark Assistant PhD supervisor: Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland",

year = "2020",

language = "English",

series = "Ph.d.-serien for Det Ingeni{\o}r- og Naturvidenskabelige Fakultet, Aalborg Universitet",

publisher = "Aalborg Universitetsforlag",

}

TY - GEN

T1 - Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

AU - Du, He

N1 - PhD supervisor: Prof. Francesco Iannuzzo, Aalborg University, Denmark Assistant PhD supervisor: Dr. Paula Diaz Reigosa, University of Applied Sciences Northwestern Switzerland (FHNW), Switzerland

PY - 2020

Y1 - 2020

KW - Silicon Carbide

KW - Power MOSFET

KW - Reliability

KW - Short-Circuit

KW - Failure Analysis

KW - Power Cycling

KW - Remaining Useful Life

KW - Degradation

M3 - PhD thesis

T3 - Ph.d.-serien for Det Ingeniør- og Naturvidenskabelige Fakultet, Aalborg Universitet

PB - Aalborg Universitetsforlag

ER -

Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

Bibliografisk note

Adgang til dokumentet

AUB Link

Publikation

A Mitigation Strategy for the Short-Circuit Degradation in SiC MOSFETs

Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis

Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence

Citationsformater