Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy

He Du

Publikation: Ph.d.-afhandling

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  • 2020

    A Mitigation Strategy for the Short-Circuit Degradation in SiC MOSFETs

    Du, H. & Iannuzzo, F., 2020, IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia 2020. IEEE, s. 1-4 4 s. 9360256

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    2 Citationer (Scopus)
    36 Downloads (Pure)
  • Implications of Short-Circuit Degradation on the Aging Process in Accelerated Cycling Tests of SiC MOSFETs

    Du, H., Baker, N. & Iannuzzo, F., aug. 2020, 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD). IEEE, s. 202-205 4 s. 9170133. (Proceedings of the International Symposium on Power Semiconductor Devices and ICs).

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    2 Citationer (Scopus)
    41 Downloads (Pure)
  • 2019

    Finite Element Modeling of IGBT Modules to Explore the Correlation between Electric Parameters and Damage in Bond Wires

    Jiang, M., Fu, G., Ceccarelli, L., Du, H., Fogsgaard, M. B., Bahman, A. S., Yang, Y. & Iannuzzo, F., sep. 2019, Proceedings of 2019 IEEE Energy Conversion Congress and Exposition (ECCE) . IEEE Press, s. 839-844 6 s. 8912236. (IEEE Energy Conversion Congress and Exposition).

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    9 Citationer (Scopus)
  • Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests

    Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 24 maj 2019, 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. IEEE Press, s. 332-337 6 s. 8722300. (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).

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    9 Citationer (Scopus)
    74 Downloads (Pure)