Fingeraftryk
Dyk ned i forskningsemnerne om 'Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests'. Sammen danner de et unikt fingeraftryk.- Sorter
- Vægt
- Alfabetisk
Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests
He Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli
Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review
10
Citationer
(Scopus)
89
Downloads
(Pure)