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In search of a hole inversion layer in Pd/MoOx/Si diodes through I- V characterization using dedicated ring-shaped test structures
Gaurav Gupta, Shivakumar D. Thammaiah, Raymond J Hueting, Lis Karen Nanver
Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review