TY - JOUR
T1 - Investigation of MOSFET failure in soft-switching conditions
AU - Iannuzzo, F.
AU - Busatto, G.
AU - Abbate, C.
PY - 2006/9/1
Y1 - 2006/9/1
N2 - Thanks to an ad-hoc experimental test equipment, the reliability of MOSFET devices in soft-switching operations has been investigated aimed to discovering the role of the freewheeling phase in the device reliability reduction. Extensive tests at several temperatures, on-state currents, reverse current peaks, dc-voltages and gate timings have been done, showing that specific devices for soft-switching are needed to improve the overall converter reliability. Standard commercial MOSFETs are more prone to failures descending from huge power dissipation at the gate turn-off, related to preceding body diode usage.
AB - Thanks to an ad-hoc experimental test equipment, the reliability of MOSFET devices in soft-switching operations has been investigated aimed to discovering the role of the freewheeling phase in the device reliability reduction. Extensive tests at several temperatures, on-state currents, reverse current peaks, dc-voltages and gate timings have been done, showing that specific devices for soft-switching are needed to improve the overall converter reliability. Standard commercial MOSFETs are more prone to failures descending from huge power dissipation at the gate turn-off, related to preceding body diode usage.
UR - http://www.scopus.com/inward/record.url?scp=33747757647&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2006.07.061
DO - 10.1016/j.microrel.2006.07.061
M3 - Journal article
AN - SCOPUS:33747757647
SN - 0026-2714
VL - 46
SP - 1790
EP - 1794
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 9-11
ER -