Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

He Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

3 Citationer (Scopus)
20 Downloads (Pure)

Abstrakt

This paper provides a comprehensive investigation on both static characteristics and short-circuit performance of 1.2 kV SiC MOSFET power modules with 2nd generation planar technology. The experimental approach is based on the static characteristics measurements and the short-circuit tests with gradual increase of pulse time duration. If any variation of the static characteristics appears, the time duration of next short-circuit tests would keep the same with the last pulse duration (approach 1) or increase continuously (approach 2). The results of the short-circuit waveforms show a gate degradation which is further confirmed with the measurement of the gate leakage current. Additionally, other degradation indicators, including positive shift of threshold voltage, drain leakage current and on-state resistance increase are evidenced and discussed in this paper. These can be used for early prediction of the degradation and failure in the short-circuit conditions.
OriginalsprogEngelsk
TidsskriftMicroelectronics Reliability
Vol/bind88-90
Sider (fra-til)661-665
Antal sider5
ISSN0026-2714
DOI
StatusUdgivet - 1 sep. 2018
Begivenhed29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Danmark
Varighed: 1 okt. 20185 okt. 2018
Konferencens nummer: 29th
http://www.esref2018conf.org/

Konference

Konference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Nummer29th
LokationAKKC
LandDanmark
ByAalborg
Periode01/10/201805/10/2018
Internetadresse

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  • Projekter

    Center Of Reliable Power Electronics (CORPE)

    Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.

    01/04/201131/12/2016

    Projekter: ProjektForskning

    Aktiviteter

    • 1 Organisering af eller deltagelse i konference

    29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

    Lorenzo Ceccarelli (Deltager)

    1 okt. 20185 okt. 2018

    Aktivitet: Deltagelse i faglig begivenhedOrganisering af eller deltagelse i konference

    Citationsformater