Lifetime Evaluation of PV Inverters considering Panel Degradation Rates and Installation Sites

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7 Citationer (Scopus)

Abstrakt

The PV inverter lifetime is affected by the installed sites related to different solar irradiance and ambient temperature profiles. In fact, the installation site also affects the PV panel degradation rate, and thus the long-term power production. Prior-art lifetime analysis in PV inverters has not yet investigated the impact of panel degradation. This paper thus evaluates the lifetime of PV inverters considering panel degradation rates and installation sites. Evaluations have been carried out on PV systems installed in Denmark and Arizona. The results reveal that the PV panel degradation rate has a considerable impact on the PV inverter lifetime, especially in the hot climate (e.g., Arizona), where the panel degrades at a faster rate. In that case, the PV inverter lifetime estimation can be deviated by 54%, if the impact of PV panel degradation is not taken into account.
OriginalsprogEngelsk
TitelProceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider8
ForlagIEEE Press
Publikationsdatomar. 2017
Sider2845-2852
ISBN (Trykt)978-1-5090-5365-0
DOI
StatusUdgivet - mar. 2017
Begivenhed2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa Convention Center, Tampa, FL, USA
Varighed: 26 mar. 201730 mar. 2017

Konference

Konference2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
LokationTampa Convention Center
LandUSA
ByTampa, FL
Periode26/03/201730/03/2017

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  • Projekter

  • Center Of Reliable Power Electronics (CORPE)

    Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.

    01/04/201131/12/2016

    Projekter: ProjektForskning

    Citationsformater

    Sangwongwanich, A., Yang, Y., Sera, D., & Blaabjerg, F. (2017). Lifetime Evaluation of PV Inverters considering Panel Degradation Rates and Installation Sites. I Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) (s. 2845-2852). IEEE Press. https://doi.org/10.1109/APEC.2017.7931101