Machine learning prediction of defect types for electroluminescence images of photovoltaic panels

Claire Mantel, Frederik Villebro, Gisele Alves dos Reis Benatto , Harsh Rajesh Parikh, Stefan Wendlandt, Kabir Hossain, Peter Poulsen, Sergiu Viorel Spataru, Dezso Séra, Søren Forchhammer

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Abstrakt

Despite recent technological advances for Photovoltaic panels maintenance (Electroluminescence imaging, drone inspection), only few large-scale studies achieve identification of the precise category of defects or faults. In this work, Electroluminescence imaged modules are automatically split into cells using projections on the x and y axes to detect cell boundaries. Regions containing potential defects or faults are then detected using Hough transform combined with mathematical morphology. Care is taken to remove most of the bus bars or cell boundaries. Afterwards, 25 features are computed, focusing on both the geometry of the regions (e.g. area, perimeter, circularity) and the statistical characteristics of their pixel values (e.g. median, standard deviation, skewness). Finally, features are mapped to the ground truth labels with Support Vector Machine (RBF kernel) and Random Forest algorithms, coupled with undersampling and SMOTE oversampling, with a stratified 5- folds approach for cross validation. A dataset of 982 Electroluminescence images of installed multi-crystalline photovoltaic modules was acquired in outdoor conditions (evening) with a CMOS sensor. After automatic blur detection, 753 images or 47244 cells remain to evaluate faults. All images were evaluated by experts in PV fault detection that labelled: Finger failures, and three types of cracks based on their respective severity levels (A, B and C). Our results based on 6 data series, yield using Support Vector Machine an accuracy of 0.997 and a recall of 0.274. Improving the region detection process will most likely allow improving the performance.
OriginalsprogEngelsk
TitelProceedings of SPIE Optical Engineering + Applications : Applications of Machine Learning
RedaktørerMichael E. Zelinski, Tarek M. Taha, Jonathan Howe, Abdul A. S. Awwal, Khan M. Iftekharuddin
Antal sider9
ForlagSPIE - International Society for Optical Engineering
Publikationsdatosep. 2019
Artikelnummer1113904
ISBN (Trykt)9781510629714
ISBN (Elektronisk)9781510629721
DOI
StatusUdgivet - sep. 2019
BegivenhedSPIE OPTICAL ENGINEERING + APPLICATIONS - San Diego, USA
Varighed: 11 aug. 201915 aug. 2019

Konference

KonferenceSPIE OPTICAL ENGINEERING + APPLICATIONS
LandUSA
BySan Diego
Periode11/08/201915/08/2019
NavnProceedings of SPIE, the International Society for Optical Engineering
Vol/bind11139
ISSN0277-786X

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Citationsformater

Mantel, C., Villebro, F., Alves dos Reis Benatto , G., Parikh, H. R., Wendlandt, S., Hossain, K., Poulsen, P., Spataru, S. V., Séra, D., & Forchhammer, S. (2019). Machine learning prediction of defect types for electroluminescence images of photovoltaic panels. I M. E. Zelinski, T. M. Taha, J. Howe, A. A. S. Awwal, & K. M. Iftekharuddin (red.), Proceedings of SPIE Optical Engineering + Applications: Applications of Machine Learning [1113904] SPIE - International Society for Optical Engineering. Proceedings of SPIE, the International Society for Optical Engineering, Bind. 11139 https://doi.org/10.1117/12.2528440