Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters

A. Sangwongwanich*, D. Zhou, E. Liivik, F. Blaabjerg

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Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

18 Citationer (Scopus)

Abstract

The operating conditions and reliability of Photovoltaic (PV) inverters are strongly affected by their mission profile. Since the mission profile of the PV system can vary considerably, the time-resolution of the mission profile becomes an important factor in the reliability prediction. In this paper, the impacts of mission profile resolutions on the reliability of the PV inverters are investigated. The results indicate that the mission profile resolution can deviate the reliability prediction considerably, especially during the fluctuating solar irradiance condition, and care must be taken during the reliability assessment.
OriginalsprogEngelsk
TidsskriftMicroelectronics Reliability
Vol/bind88-90
Sider (fra-til)1003-1007
Antal sider5
ISSN0026-2714
DOI
StatusUdgivet - sep. 2018
Begivenhed29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Danmark
Varighed: 1 okt. 20185 okt. 2018
Konferencens nummer: 29th
http://www.esref2018conf.org/

Konference

Konference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Nummer29th
LokationAKKC
Land/OmrådeDanmark
ByAalborg
Periode01/10/201805/10/2018
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