Model-based daylight- A nd chroma-adaptive segmentation method

Hans Jorgen Andersen, Erik Granum, C. M. Onyango

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

4 Citationer (Scopus)


An image segmentation method based on the dichromatic reflection model, is introduced. To adapt to changing illumination conditions the image formation process is modelled by the camera characteristics, the reflectance of the object of interest, and the CIE daylight standard. A priori, loci for the body and surface reflection for the object of interest is modeled according to changes of the illumination by CIE daylight standard. That two loci is approximated by two lines and the plane defined by these is used initially for segmentation. In the case of two objects, the image is segmented by the plane which is rotated about the surface locus to minimize Wilks (lambda). The method is used for segmenting four images ranging in correlated color temperature from 5200 K to 11500 K. To assess its performance the four images were manually segmented into three classes: Vegetation, background, and an uncertain class. The method adapted to the changing light condition with total errors ranging from 3% to 12% and higher error rates being in the images with the largest uncertain group. The method was also compared with Bayes minimax criteria for finding the 'best' rotation from which it deviated by only 0.8% on average.

BogserieProceedings of SPIE - The International Society for Optical Engineering
Sider (fra-til)136-147
Antal sider12
StatusUdgivet - 1999
BegivenhedPolarization and Color Techniques in Industrial Inspection 1999 - Munich, Tyskland
Varighed: 14 jun. 199918 jun. 1999


KonferencePolarization and Color Techniques in Industrial Inspection 1999

Bibliografisk note

Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.


Dyk ned i forskningsemnerne om 'Model-based daylight- A nd chroma-adaptive segmentation method'. Sammen danner de et unikt fingeraftryk.