Mutation-Based Test-Case Generation with Ecdar

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10 Citationer (Scopus)
5 Downloads (Pure)
OriginalsprogEngelsk
TitelProceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
Antal sider10
ForlagIEEE
Publikationsdato13 apr. 2017
Sider319-328
Artikelnummer7899077
ISBN (Elektronisk)9781509066766, 978-1-5090-6677-3
DOI
StatusUdgivet - 13 apr. 2017
Begivenhed10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017 - Tokyo, Japan
Varighed: 13 mar. 201717 mar. 2017

Konference

Konference10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
LandJapan
ByTokyo
Periode13/03/201717/03/2017
SponsorAster, et al., IEEE, IEEE Computer Society, Japan Software Testing Qualifications Board (JSTQB), Waseda University

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