Abstract
A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.
Originalsprog | Engelsk |
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Bogserie | Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE) |
Vol/bind | 5118 |
Sider (fra-til) | 541-548 |
Antal sider | 8 |
ISSN | 0277-786X |
DOI | |
Status | Udgivet - 2003 |