Non-destructive detection of current distribution in power modules based on pulsed magnetic measurement

G. Busatto; F. Iannuzzo; F. Velardi; M. Valentino; G. P. Pepe

doi:10.1016/S0026-2714(03)00324-X

Non-destructive detection of current distribution in power modules based on pulsed magnetic measurement

G. Busatto^*, F. Iannuzzo, F. Velardi, M. Valentino, G. P. Pepe

^*Kontaktforfatter

Publikation: Bidrag til tidsskrift › Konferenceartikel i tidsskrift › Forskning › peer review

Abstract

A new non destructive technique able to evaluate current distribution inside a power module is presented. It is based on the dynamic measurement of the map of the magnetic field close to the backside of the module underneath its base-plate. This magnetic filed is sensitive to the eddy currents and the proper value of the magnetic field can be extracted by identifying a suited time interval on the dynamic response of the sensor. The paper shows that the magnetic field is sensitive to the current flowing through the connections between the chips and is sensitive to current variation lower than 5% of the nominal current.

Originalsprog	Engelsk
Tidsskrift	Microelectronics Reliability
Vol/bind	43
Udgave nummer	9-11
Sider (fra-til)	1907-1912
Antal sider	6
ISSN	0026-2714
DOI	https://doi.org/10.1016/S0026-2714(03)00324-X
Status	Udgivet - 1 sep. 2003
Udgivet eksternt	Ja
Begivenhed	14th European Symposium on Reliability of Electron Devices, Fa - Bordeaux, France, Frankrig Varighed: 7 okt. 2003 → 10 okt. 2003

Konference

Konference	14th European Symposium on Reliability of Electron Devices, Fa
Land/Område	Frankrig
By	Bordeaux, France
Periode	07/10/2003 → 10/10/2003

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10.1016/S0026-2714(03)00324-X

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Citationsformater

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title = "Non-destructive detection of current distribution in power modules based on pulsed magnetic measurement",

abstract = "A new non destructive technique able to evaluate current distribution inside a power module is presented. It is based on the dynamic measurement of the map of the magnetic field close to the backside of the module underneath its base-plate. This magnetic filed is sensitive to the eddy currents and the proper value of the magnetic field can be extracted by identifying a suited time interval on the dynamic response of the sensor. The paper shows that the magnetic field is sensitive to the current flowing through the connections between the chips and is sensitive to current variation lower than 5% of the nominal current.",

author = "G. Busatto and F. Iannuzzo and F. Velardi and M. Valentino and Pepe, {G. P.}",

year = "2003",

month = sep,

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doi = "10.1016/S0026-2714(03)00324-X",

language = "English",

volume = "43",

pages = "1907--1912",

journal = "Microelectronics Reliability",

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AU - Busatto, G.

AU - Iannuzzo, F.

AU - Velardi, F.

AU - Valentino, M.

AU - Pepe, G. P.

PY - 2003/9/1

Y1 - 2003/9/1

N2 - A new non destructive technique able to evaluate current distribution inside a power module is presented. It is based on the dynamic measurement of the map of the magnetic field close to the backside of the module underneath its base-plate. This magnetic filed is sensitive to the eddy currents and the proper value of the magnetic field can be extracted by identifying a suited time interval on the dynamic response of the sensor. The paper shows that the magnetic field is sensitive to the current flowing through the connections between the chips and is sensitive to current variation lower than 5% of the nominal current.

AB - A new non destructive technique able to evaluate current distribution inside a power module is presented. It is based on the dynamic measurement of the map of the magnetic field close to the backside of the module underneath its base-plate. This magnetic filed is sensitive to the eddy currents and the proper value of the magnetic field can be extracted by identifying a suited time interval on the dynamic response of the sensor. The paper shows that the magnetic field is sensitive to the current flowing through the connections between the chips and is sensitive to current variation lower than 5% of the nominal current.

UR - http://www.scopus.com/inward/record.url?scp=0042193153&partnerID=8YFLogxK

U2 - 10.1016/S0026-2714(03)00324-X

DO - 10.1016/S0026-2714(03)00324-X

M3 - Conference article in Journal

AN - SCOPUS:0042193153

SN - 0026-2714

VL - 43

SP - 1907

EP - 1912

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-11

T2 - 14th European Symposium on Reliability of Electron Devices, Fa

Y2 - 7 October 2003 through 10 October 2003

ER -

Non-destructive detection of current distribution in power modules based on pulsed magnetic measurement

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