On-line reliability assessment for an electronic system subject to condition monitoring

Shuai Zhao, Viliam Makis, Shaowei Chen, Yong Li

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10 Citationer (Scopus)

Abstract

We present a new approach for the on-line reliability assessment of an electronic system subject to condition monitoring. In this paper, the degradation of the electronic system is driven by a nonlinear Wiener process with a time drift, which is incorporated into the proportional hazards model to describe the hazard rate of the time to failure. Using the discretization of the degradation path and the time axis, closed-form approximations for the reliability quantities are obtained using the transition probability matrix. Unlike the conventional method which is applicable only for a small number of degradation states, the calculation of these quantities can be accomplished with just the basic manipulation of the transition matrix, which is computationally efficient and applicable to real-time conditional reliability calculation for a general number of states. The effectiveness of the proposed approach is demonstrated by a numerical study.
OriginalsprogEngelsk
Titel2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016
ForlagIEEE Signal Processing Society
Publikationsdato12 aug. 2016
Artikelnummer7542817
ISBN (Elektronisk)9781509003822
DOI
StatusUdgivet - 12 aug. 2016
Udgivet eksterntJa
Begivenhed2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016 - Ottawa, Canada
Varighed: 20 jun. 201622 jun. 2016

Konference

Konference2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016
Land/OmrådeCanada
ByOttawa
Periode20/06/201622/06/2016
Navn2016 IEEE International Conference on Prognostics and Health Management, ICPHM 2016

Bibliografisk note

Publisher Copyright:
© 2016 IEEE.

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