On-Wafer 3-port S-parameter Calibration

Michael Bohl Jenner

Publikation: Bog/antologi/afhandling/rapportBogForskning

OriginalsprogEngelsk
Udgivelses stedAalborg
ForlagAalborg Universitetsforlag
StatusUdgivet - 1997
NavnTechnical Report
NummerR97-1006
ISSN0908-1224

Citer dette

Jenner, M. B. (1997). On-Wafer 3-port S-parameter Calibration. Aalborg: Aalborg Universitetsforlag. Technical Report, Nr. R97-1006
Jenner, Michael Bohl. / On-Wafer 3-port S-parameter Calibration. Aalborg : Aalborg Universitetsforlag, 1997. (Technical Report; Nr. R97-1006).
@book{5966a710003411dab4d5000ea68e967b,
title = "On-Wafer 3-port S-parameter Calibration",
author = "Jenner, {Michael Bohl}",
year = "1997",
language = "English",
series = "Technical Report",
number = "R97-1006",
publisher = "Aalborg Universitetsforlag",

}

Jenner, MB 1997, On-Wafer 3-port S-parameter Calibration. Technical Report, nr. R97-1006, Aalborg Universitetsforlag, Aalborg.

On-Wafer 3-port S-parameter Calibration. / Jenner, Michael Bohl.

Aalborg : Aalborg Universitetsforlag, 1997. (Technical Report; Nr. R97-1006).

Publikation: Bog/antologi/afhandling/rapportBogForskning

TY - BOOK

T1 - On-Wafer 3-port S-parameter Calibration

AU - Jenner, Michael Bohl

PY - 1997

Y1 - 1997

M3 - Book

T3 - Technical Report

BT - On-Wafer 3-port S-parameter Calibration

PB - Aalborg Universitetsforlag

CY - Aalborg

ER -

Jenner MB. On-Wafer 3-port S-parameter Calibration. Aalborg: Aalborg Universitetsforlag, 1997. (Technical Report; Nr. R97-1006).