Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography

Pramod Ghimire; Kristian Bonderup Pedersen; Ionut Trintis; Bjørn Rannested; Stig Munk-Nielsen; Paul  Thøgersen

doi:10.1109/ECCE.2015.7310584

Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography

Pramod Ghimire, Kristian Bonderup Pedersen, Ionut Trintis, Bjørn Rannested, Stig Munk-Nielsen, Paul Thøgersen

AAU Energi

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

19 Citationer (Scopus)

Abstract

This paper presents on-state collector-emitter voltage (υce, on)-load current (Ic) method to monitor chip temperature on power insulated gate bipolar transistor (IGBT) modules in converter operation. The measurement method is also evaluated using infrared (IR) thermography. Temperature dependencies of υce, on at load current is measured and temperature dependency calibration factor is formulated. This method needs a correction to compensate a deviation in the interconnection resistance from homogeneous temperature field in calibration to non-homogeneous field in loading. The correction parameter is obtained from a static calibration and the method is proposed in the paper. Ageing compensation in estimating the temperature is illustrated. The correction parameter is also analysed in finite element model and also investigated experimentally superimposing heat by conducting device for a longer time in the calibration.

Originalsprog	Engelsk
Titel	Proceedings of the 2015 IEEE Energy Conversion Congress and Exposition (ECCE)
Antal sider	8
Forlag	IEEE Press
Publikationsdato	20 sep. 2015
Sider	6602 - 6609
ISBN (Trykt)	978-1-4673-7151-3
DOI	https://doi.org/10.1109/ECCE.2015.7310584
Status	Udgivet - 20 sep. 2015
Begivenhed	2015 IEEE Energy Conversion Congress and Exposition (ECCE) - Montreal, Canada Varighed: 20 sep. 2015 → 24 sep. 2015

Konference

Konference	2015 IEEE Energy Conversion Congress and Exposition (ECCE)
Land/Område	Canada
By	Montreal
Periode	20/09/2015 → 24/09/2015

Adgang til dokumentet

10.1109/ECCE.2015.7310584

AUB Link

Søg efter materialet i Aalborg Universitetsbiblioteks søgemaskine

Andre filer og links

https://www.scopus.com/record/display.uri?eid=2-s2.0-84962944408&origin=inward&txGid=0

Citationsformater

@inproceedings{5dab211391934be38c2e638d3d959ea9,

title = "Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography",

abstract = "This paper presents on-state collector-emitter voltage (υce, on)-load current (Ic) method to monitor chip temperature on power insulated gate bipolar transistor (IGBT) modules in converter operation. The measurement method is also evaluated using infrared (IR) thermography. Temperature dependencies of υce, on at load current is measured and temperature dependency calibration factor is formulated. This method needs a correction to compensate a deviation in the interconnection resistance from homogeneous temperature field in calibration to non-homogeneous field in loading. The correction parameter is obtained from a static calibration and the method is proposed in the paper. Ageing compensation in estimating the temperature is illustrated. The correction parameter is also analysed in finite element model and also investigated experimentally superimposing heat by conducting device for a longer time in the calibration.",

author = "Pramod Ghimire and Pedersen, {Kristian Bonderup} and Ionut Trintis and Bj{\o}rn Rannested and Stig Munk-Nielsen and Paul Th{\o}gersen",

year = "2015",

month = sep,

day = "20",

doi = "10.1109/ECCE.2015.7310584",

language = "English",

isbn = "978-1-4673-7151-3",

pages = "6602 -- 6609 ",

booktitle = "Proceedings of the 2015 IEEE Energy Conversion Congress and Exposition (ECCE)",

publisher = "IEEE Press",

note = "2015 IEEE Energy Conversion Congress and Exposition (ECCE) ; Conference date: 20-09-2015 Through 24-09-2015",

}

Ghimire, P, Pedersen, KB, Trintis, I, Rannested, B, Munk-Nielsen, S & Thøgersen, P 2015, Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography. i Proceedings of the 2015 IEEE Energy Conversion Congress and Exposition (ECCE). IEEE Press, s. 6602 - 6609 , 2015 IEEE Energy Conversion Congress and Exposition (ECCE), Montreal, Canada, 20/09/2015. https://doi.org/10.1109/ECCE.2015.7310584

Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography. / Ghimire, Pramod; Pedersen, Kristian Bonderup; Trintis, Ionut et al.
Proceedings of the 2015 IEEE Energy Conversion Congress and Exposition (ECCE). IEEE Press, 2015. s. 6602 - 6609 .

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography

AU - Ghimire, Pramod

AU - Pedersen, Kristian Bonderup

AU - Trintis, Ionut

AU - Rannested, Bjørn

AU - Munk-Nielsen, Stig

AU - Thøgersen, Paul

PY - 2015/9/20

Y1 - 2015/9/20

N2 - This paper presents on-state collector-emitter voltage (υce, on)-load current (Ic) method to monitor chip temperature on power insulated gate bipolar transistor (IGBT) modules in converter operation. The measurement method is also evaluated using infrared (IR) thermography. Temperature dependencies of υce, on at load current is measured and temperature dependency calibration factor is formulated. This method needs a correction to compensate a deviation in the interconnection resistance from homogeneous temperature field in calibration to non-homogeneous field in loading. The correction parameter is obtained from a static calibration and the method is proposed in the paper. Ageing compensation in estimating the temperature is illustrated. The correction parameter is also analysed in finite element model and also investigated experimentally superimposing heat by conducting device for a longer time in the calibration.

AB - This paper presents on-state collector-emitter voltage (υce, on)-load current (Ic) method to monitor chip temperature on power insulated gate bipolar transistor (IGBT) modules in converter operation. The measurement method is also evaluated using infrared (IR) thermography. Temperature dependencies of υce, on at load current is measured and temperature dependency calibration factor is formulated. This method needs a correction to compensate a deviation in the interconnection resistance from homogeneous temperature field in calibration to non-homogeneous field in loading. The correction parameter is obtained from a static calibration and the method is proposed in the paper. Ageing compensation in estimating the temperature is illustrated. The correction parameter is also analysed in finite element model and also investigated experimentally superimposing heat by conducting device for a longer time in the calibration.

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-84962944408&origin=inward&txGid=0

U2 - 10.1109/ECCE.2015.7310584

DO - 10.1109/ECCE.2015.7310584

M3 - Article in proceeding

SN - 978-1-4673-7151-3

SP - 6602

EP - 6609

BT - Proceedings of the 2015 IEEE Energy Conversion Congress and Exposition (ECCE)

PB - IEEE Press

T2 - 2015 IEEE Energy Conversion Congress and Exposition (ECCE)

Y2 - 20 September 2015 through 24 September 2015

ER -

Online Chip Temperature Monitoring Using υce-Load Current and IR Thermography

Abstract

Konference

Adgang til dokumentet

AUB Link

Andre filer og links

Fingeraftryk

Citationsformater