| Originalsprog | Engelsk |
|---|---|
| Titel | Proceedings - 2018 IEEE 19th International Conference on Mobile Data Management, MDM 2018 |
| Antal sider | 10 |
| Vol/bind | 2018-June |
| Forlag | IEEE |
| Publikationsdato | 13 jul. 2018 |
| Sider | 125-134 |
| ISBN (Elektronisk) | 9781538641330 |
| DOI | |
| Status | Udgivet - 13 jul. 2018 |
| Begivenhed | 19th IEEE International Conference on Mobile Data Management, MDM 2018 - Aalborg, Danmark Varighed: 25 jun. 2018 → 28 jun. 2018 |
Konference
| Konference | 19th IEEE International Conference on Mobile Data Management, MDM 2018 |
|---|---|
| Land | Danmark |
| By | Aalborg |
| Periode | 25/06/2018 → 28/06/2018 |
| Sponsor | Aalborg University, Center for Data-Intensive Systems (DAISY), Aalborg University, IEEE, IEEE Technical Committee on Data Engineering (TCDE), Otto Monsted Foundation |
| Navn | IEEE International Conference on Mobile Data Management (MDM) |
|---|---|
| ISSN | 2375-0324 |
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Outlier detection for multidimensional time series using deep neural networks. / Kieu, Tung; Yang, Bin; Jensen, Christian Søndergaard.
Proceedings - 2018 IEEE 19th International Conference on Mobile Data Management, MDM 2018. Bind 2018-June IEEE, 2018. s. 125-134 (IEEE International Conference on Mobile Data Management (MDM)).Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review
TY - GEN
T1 - Outlier detection for multidimensional time series using deep neural networks
AU - Kieu, Tung
AU - Yang, Bin
AU - Jensen, Christian Søndergaard
PY - 2018/7/13
Y1 - 2018/7/13
KW - Deep Neural Networks
KW - Outlier Detection
KW - Time Series
UR - http://www.scopus.com/inward/record.url?scp=85050812217&partnerID=8YFLogxK
U2 - 10.1109/MDM.2018.00029
DO - 10.1109/MDM.2018.00029
M3 - Article in proceeding
AN - SCOPUS:85050812217
VL - 2018-June
T3 - IEEE International Conference on Mobile Data Management (MDM)
SP - 125
EP - 134
BT - Proceedings - 2018 IEEE 19th International Conference on Mobile Data Management, MDM 2018
PB - IEEE
ER -