Abstract
This paper deals with the precise modeling of droop controlled parallel inverters. This is very attractive since that is a common structure that can be found in a stand-alone droopcontrolled MicroGrid. The conventional small-signal dynamic is not able to predict instabilities of the system, so that in this
paper, the combination of both small signal model and dynamic phasor model (DPM) of parallel-connected inverters is presented.
Simulation results show that the dynamic phasor model is able to predict accurately the stability margins of the system when the droop control gains exceed certain values. In addition, the virtual ω-E frame power control method, which deals with the power coupling caused by the line impedance X/R characteristic, has been chosen as an application example of this modeling
technique.
paper, the combination of both small signal model and dynamic phasor model (DPM) of parallel-connected inverters is presented.
Simulation results show that the dynamic phasor model is able to predict accurately the stability margins of the system when the droop control gains exceed certain values. In addition, the virtual ω-E frame power control method, which deals with the power coupling caused by the line impedance X/R characteristic, has been chosen as an application example of this modeling
technique.
| Originalsprog | Engelsk |
|---|---|
| Titel | Proceedings of the 21st IEEE International Symposium on Industrial Electronics (ISIE), 2012 |
| Antal sider | 6 |
| Forlag | IEEE (Institute of Electrical and Electronics Engineers) |
| Publikationsdato | 2012 |
| Sider | 475-480 |
| ISBN (Trykt) | 978-1-4673-0159-6 |
| ISBN (Elektronisk) | 978-1-4673-0157-2 |
| DOI | |
| Status | Udgivet - 2012 |
| Begivenhed | 21st IEEE International Symposium on Industrial Electronics - , Kina Varighed: 28 maj 2012 → 31 maj 2012 |
Konference
| Konference | 21st IEEE International Symposium on Industrial Electronics |
|---|---|
| Land/Område | Kina |
| Periode | 28/05/2012 → 31/05/2012 |
| Navn | Industrial Electronics (ISIE), IEEE International Symposium on |
|---|---|
| ISSN | 2163-5137 |
Fingeraftryk
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