Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

Patrick Steffen Pedersen, Jan Østergaard, Torben Larsen

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

1 Citation (Scopus)
OriginalsprogEngelsk
Titel2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)
ForlagIEEE Signal Processing Society
Publikationsdato14 dec. 2015
Sider418 - 422
ISBN (Elektronisk)978-1-4799-7591-4
DOI
StatusUdgivet - 14 dec. 2015
Begivenhed3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015) - Orlando, FL, USA
Varighed: 14 dec. 201516 dec. 2015

Konference

Konference3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP'2015)
LandUSA
ByOrlando, FL
Periode14/12/201516/12/2015
NavnIEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings

Citer dette

Pedersen, P. S., Østergaard, J., & Larsen, T. (2015). Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. I 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP) (s. 418 - 422). IEEE Signal Processing Society. IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings https://doi.org/10.1109/GlobalSIP.2015.7418229
Pedersen, Patrick Steffen ; Østergaard, Jan ; Larsen, Torben. / Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. s. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).
@inproceedings{a16ebda86a484f038b5268eeec4b2278,
title = "Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy",
author = "Pedersen, {Patrick Steffen} and Jan {\O}stergaard and Torben Larsen",
year = "2015",
month = "12",
day = "14",
doi = "10.1109/GlobalSIP.2015.7418229",
language = "English",
pages = "418 -- 422",
booktitle = "2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)",
publisher = "IEEE Signal Processing Society",
address = "United States",

}

Pedersen, PS, Østergaard, J & Larsen, T 2015, Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. i 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings, s. 418 - 422, Orlando, FL, USA, 14/12/2015. https://doi.org/10.1109/GlobalSIP.2015.7418229

Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. / Pedersen, Patrick Steffen; Østergaard, Jan; Larsen, Torben.

2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society, 2015. s. 418 - 422 (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings).

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

TY - GEN

T1 - Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy

AU - Pedersen, Patrick Steffen

AU - Østergaard, Jan

AU - Larsen, Torben

PY - 2015/12/14

Y1 - 2015/12/14

U2 - 10.1109/GlobalSIP.2015.7418229

DO - 10.1109/GlobalSIP.2015.7418229

M3 - Article in proceeding

SP - 418

EP - 422

BT - 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP)

PB - IEEE Signal Processing Society

ER -

Pedersen PS, Østergaard J, Larsen T. Predicting Reconstruction Quality Within Compressive Sensing for Atomic Force Microscopy. I 2015 IEEE Global Conference on Signal and Information Processing (GlobalSIP). IEEE Signal Processing Society. 2015. s. 418 - 422. (IEEE Global Conference on Signal and Information Processing (GlobalSIP). Proceedings). https://doi.org/10.1109/GlobalSIP.2015.7418229