Quantification of Solar Cell Failure Signatures Based on Statistical Analysis of Electroluminescence Images

Sergiu Spataru, Harsh Parikh, Peter Hacke, Gisele Alves dos Reis Benatto , Dezso Sera, Peter Behrensdorff Poulsen

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Abstrakt

We demonstrate a method to quantify the extent of solar cell cracks, shunting, or damaged cell interconnects, present in crystalline silicon photovoltaic (PV) modules by statistical analysis of the electroluminescence (EL) intensity distributions of individual cells within the module. From the EL intensity distributions (ELID) of each cell, we calculated summary statistics such as standard deviation, median, skewness and kurtosis, and analyzed how they correlate with the magnitude of the solar cell degradation. We found that the dispersion of the ELID increases with the size and severity of the solar cell cracks, correlating with an increase in standard deviation and decrease in kurtosis. For shunted cells, we found that the ELID median is strongly correlated with the extent of cell shunting. Last, cells with damaged interconnect ribbons show current crowding and increased series resistance regions, characterized by increased dispersion and skewness of the ELID. These cell-level diagnostic parameters can be used quantify the level of mismatch between the solar cells in the module, which can represent the extent of the module degradation, due to transportation, installation, or field operation. The method can be easily automated for quality control by module manufacturers or installers, or as a diagnostic tool by plant operators and diagnostic service providers.
OriginalsprogEngelsk
TitelProceedings of the 33rd European Photovoltaic Solar Energy Conference and Exhibition
Antal sider7
ForlagWIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG
Publikationsdato2017
Sider1466-1472
ISBN (Trykt)3-936338-47-7
DOI
StatusUdgivet - 2017
Begivenhed33rd European Photovoltaic Solar Energy Conference and Exhibition - RAI Convention & Exhibition Centre, Amsterdam, Holland
Varighed: 25 sep. 201729 sep. 2017
Konferencens nummer: 33
https://www.photovoltaic-conference.com/

Konference

Konference33rd European Photovoltaic Solar Energy Conference and Exhibition
Nummer33
LokationRAI Convention & Exhibition Centre
LandHolland
ByAmsterdam
Periode25/09/201729/09/2017
Internetadresse

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Citationsformater

Spataru, S., Parikh, H., Hacke, P., Alves dos Reis Benatto , G., Sera, D., & Poulsen, P. B. (2017). Quantification of Solar Cell Failure Signatures Based on Statistical Analysis of Electroluminescence Images. I Proceedings of the 33rd European Photovoltaic Solar Energy Conference and Exhibition (s. 1466-1472). WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG. https://doi.org/10.4229/EUPVSEC20172017-5CO.8.5