Quantification Problems in Depth Profiling of PWR Steels using Ar+ Ion Sputtering and XPS Analysis

V.A. Ignatova, Sven Van Den Berghe, Steven Van Dyck, Vladimir Popok

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

7 Citationer (Scopus)

Abstract

In this work we studied the oxide scales of AISI 304 formed in high temperature boric acid solutions at about 300oC temperature and pH = 4.5 using XPS depth profiling. The focus of this paper is the spectra deconvolution and data interpretation aiming at reliable speciation and improving the depth profiles quantification. The roughness of the samples is studied by AFM before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer. The elemental distribution as a function of the sputtering time is obtained and formation of two layers is observed – one hydroxide (mainly iron-nickel based) on top and a second one deeper, mainly consisting of iron-chromium oxides.
OriginalsprogEngelsk
TidsskriftMicroscopy and Microanalysis
Vol/bind12
Udgave nummer5
Sider (fra-til)432-437
Antal sider6
ISSN1431-9276
DOI
StatusUdgivet - maj 2006
Udgivet eksterntJa

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